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Formal Specification Language for Automated Test Program Generation in Built-in Self-Test Systems

This document outlines the objectives and specifications for creating effective test programs for Built-in Self-Test (BIST) systems. It identifies key information sources necessary for generating test programs, presents a formal yet simple specification language, and details basic test operations for controlling BIST infrastructure. The guideline covers controlling internal test resources, synchronizing with external resources, and generating test programs with an emphasis on clarity for educational purposes. Increased automation in generating test programs is encouraged for efficiency.

hayley-hill
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Formal Specification Language for Automated Test Program Generation in Built-in Self-Test Systems

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  1. A BS test controller model J. M. Martins Ferreira FEUP / DEEC - Rua dos Bragas 4050-123 Porto - PORTUGAL Tel. 351-22-2041748 / Fax: 351-22-2003610 (jmf@fe.up.pt / http://www.fe.up.pt/~jmf)

  2. Objectives • To identify what are the main information sources required to enable test program generation for BS boards • To present a formal (yet simple) specification language that enables the student to write test programs for real case studies

  3. Outline • Basic test operations • To control the BS infrastructure • To synchronise the BS infrastructure with external test resources • To control internal test resources and test program flow • The test instruction set for each type of basic test operations • Test program generation

  4. Basic test operations to control the BS infrastructure (1) • Apply an active-low pulse in /TRST • Apply a TCK cycle while TMS is fixed at a pre-defined (0 or 1) logic value • Shift a bit stream into the selected scan chain, without comparing the bits shifted out with any expected responses (the TMS line must be held at 0 except in the last TCK cycle, when it must be held at 1)

  5. Basic test operations to control the BS infrastructure (2) • Shift a bit stream into the selected scan chain, while the bit stream shifted out is checked against expected values in pre-defined bit locations (the TMS line must be held at 0 except in the last TCK cycle, when it must be held at 1) • Apply N TCK cycles while TMS is held at 0 • Select the BS chain in which the following test operations are to take place

  6. Basic test operations for synchronisation purposes • Set the synchronisation output to a pre-defined logic value (0 or 1) • Wait until the synchronisation input is set to a pre-defined logic value (0 or 1)

  7. Basic test operations to control internal resources and test flow • Load an internal counter with the required number of TCK cycles • Select the error flag to be set if an expected value is not found • Perform a conditional jump in the test program flow according to the value of the selected error flag • Conclude the test program

  8. Instructions to control the BS infrastructure

  9. The bit stream in the NSHCP instruction (NSHFCP $new,$expected,$masks) • NSHFCP $55,$30,$F0,$00,$50,$F0 • Shifts in a test vector that forces the last 8 cells (8..15) to 01010101 and all the first 8 cells (0..7) to 0 • Checks that cells (0..3) capture 0101 and cells (8..11) capture 0011

  10. Instructions for synchronisation with external test resources

  11. Instructions to control internal test resources and test flow

  12. Test program generation • The low abstraction level of the proposed instruction set makes “manual” test program development tedious and error-prone • It is highly desirable to have an automatic test program generation tool • However, our pedagogical objective would not be achieved if the small details of controlling the BS chain at bit-level were omitted

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