Yield loss caused by bacterial streak in the wheat - PowerPoint PPT Presentation

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Yield loss caused by bacterial streak in the wheat

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  1. Yield loss caused by bacterial streak in the wheat (Xanthomonastranslucenspv. translucens)

  2. Bacterial leaf streak (BLS) - Black chaff • أهمية المرض:- • فى بعض الحالات يسبب خسائر تصل لــ 40% فى ولاية idaho فى امريكا . • ايضا يسبب عقم للسنابل بنسبة 5-10% عند الرى بالرش . • خطورة المرض تكمن فى : من الامراض الكامنة فى البذور(الحبوب)- مداه العوائلى واسع حيث يصيب جميع النباتات التى تنتج حبوب(الشعير – الشوفان – القمح – بعض الحشائش المصاحبة لهذه النباتات) – درجات الحرارة المناسبة له هى 15-30 درجةـــ المناطق التى بها رطوبة و دافئة ذات ليالى باردة – كذلك ينتشر فى المناطق التى بها تغير فجائى فى درجات الحرارة • الدول الذى ينتشر بها:- أمريكا- كندا- المكسيك- الارجنتين- البرازيل- بيرو- الصين- باكستان- ايران- الهند- سوريا- اسرائيل- اليمن- تركيا-تنزانيا- ليبيا- مدغشقر- زامبيا- موروكو- استراليا. • لا ينتشر فى وسط اوروبا لشدة البرودة

  3. Symptoms Bacterial leaf streak (BLS) - Black chaff

  4. ( Disease cycle of Xanthomonastranslucenspv. translucens)

  5. Condensed summary of the Zadoks two-digit code system for growth staging in wheat with corresponding Feekes scale

  6. فترة المعاملة بالمبيدات الفطرية مرحلة التسميد Tillering STAGE 1-5 Stem extension STAGE 6-10 Ripening STAGE 11 Heading STAGE 10.1-10.5

  7. Stage (10.5.4 – 11.2) Kernel watery ripe Milk Dough Soft dough Hard dough Head at approximately physiological maturity when the kernels have attained maximum dry weight. Note the green color is gone from the peduncle and head parts

  8. Relationship between the grain weight per spike and the severity of bacterial streak at GS 10.5.4 caused by Xanthomonastranslucenspv. translucens in the winter wheat cultivar Savannah in Baton Rouge, Louisiana, in 1993 and 1994.

  9. Relationship between the number of kernels per spike and the severity of bacterial streak at GS 10.5.4 caused by Xanthomonastranslucenspv. translucens in the winter wheat cultivar Savannah in Baton Rouge, Louisiana, in 1993 and 1994.

  10. Relationship between the grain weight per spike and the severity of bacterial streak at GS 10.5.4 caused by Xanthomonastranslucenspv. translucens in the winter wheat cultivar Florida 304 in Alexandria and Baton Rouge, Louisiana.

  11. Data were analyzed with the GLM procedure of SAS(SAS Institute, Cary, NC) using the fixed model : • Yijk = µ+R(L)ij + Lj+Tk + TLkj + Eijk • Yijkis the response of treatment (T) k in replication (R)i within location (L)j ; µ is the overall mean: TLkj is the interaction between treatments and locations ; and Eijk is the residual.

  12. Approximate percent loss of yield caused by leaf rust at combinations of leaf rust severity and growth stage of wheat