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Functional & AC Testing: Procedures, Parameters, and Best Practices

Explore the essentials of Functional and AC testing, covering test frequencies, pin levels, timings, signal formats, and vector sequencing for efficient and effective testing processes. Learn about VDD min/max, VIL/VIH, VOL/VOH, IOL/IOH, and more.

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Functional & AC Testing: Procedures, Parameters, and Best Practices

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  1. Functional & AC Testing • Test Frequency • Pin • Level • Timings & Signal formats • Vector

  2. 與開發程式有關的item • VDD min/max • VIL/VIH • VOL/VOH • IOL/IOH • Test Frequency • Input signal timings • Input signal formats • Out put timings • Vector sequencing

  3. Input data • Test vector data • instructions or stimuli to the DUT • Input signal timing • signal transition points • Input signal formats • wave shapes • Input levels • VIL/VIH • Time set selections • if more than one time set is used

  4. Output data • Test vector data • expected logic states from the DUT • Output strobe timing • when to sample outputs within the test cycle • VOL/VOH • expected output levels from DUT • IOL/IOH • output current loading • Time set selections • if more than one time set is used

  5. Testing output

  6. Vector data

  7. Functional testing

  8. Executing a Functional test • Define VDD level • Define input and output levels • Define output current loading • Define test cycle time • Define input timings and formats for all input pins • Define output strobe timings for all output pins • Define start and stop locations for vector memory • Execute the test

  9. Relaxed parameters • VIL↓、VIH↑ • VOL=VOH=1.5v • Period↑(Freq↓) • setup & hold time↑ • output propagation delay↑

  10. VIL/VIH test • VIL=0.1*VDD， VIH=0.9*VDD

  11. VOL/IOL VOH/IOH test • VOL=0.4*VDD，VOH=0.6*VDD

  12. Functional IOZ

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