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Please join us for a Focused Ion Beam One Day Short Course on the Analytical Instrumentation Facility’s DualBeam FIB. January 24th, 2014 For more details and to register Please contact Dale Batchelor at dale_batchelor@ncsu.edu.
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Please join us for aFocused Ion Beam One Day Short Courseon the Analytical Instrumentation Facility’s DualBeam FIB • January 24th, 2014 • For more details and to register • Please contact Dale Batchelor at dale_batchelor@ncsu.edu NCSU’s Analytical Instrumentation Facility (AIF) is givinga FIB short course that includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To insure each student receives a maximum oftime on the FIB, the course will be limited to 6 participants. Jan. 24, 2014 8:30 – 5:30 MRC room 324