October 15th , 2014 For more details and to register

1. Please join us for aFocused Ion Beam One Day Short Courseon the Analytical Instrumentation Facility’s Dual Beam FIB • October 15th, 2014 • For more details and to register • Please contact Fred Stevie at fred_stevie@ncsu.edu NCSU’s Analytical Instrumentation Facility (AIF) is giving a FIB short course that includes lectures covering an introduction to the FIB technique, an overview of the principles and operation of the FIB as well as applications such as FIB prepared SEM and TEM cross section. Also, there will be hands on demos of these applications on the AIF Quanta Dual Beam FIB-SEM. To insure each student receives a maximum of time on the FIB, the course will be limited to 6 participants. Oct. 15, 2014 8:30 – 5:30 MRC room 324