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Designing a Robust Activemask for Integrated Circuit Grounding

This document outlines the specifications and guidelines for creating an effective activemask for ensuring good electrical contact to ground (GND) in integrated circuit designs. It discusses the importance of substrate (P-sub) connections, the integration of well structures, and optimization of n+ and p+ dopants to enhance performance. The activemask strategy aims to minimize contact resistance and improve signal integrity in semiconductor devices. Emphasis is placed on achieving reliable connections and maintaining operational stability.

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Designing a Robust Activemask for Integrated Circuit Grounding

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  1. n+ n+ N - well P sub Activemask

  2. GND VDD n+ n+ n+ p+ N - well for good contact to GND P sub poly Activemask

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