150 likes | 237 Views
This summary discusses electron diffraction in Transmission Electron Microscopy (TEM), explaining concepts such as reciprocal lattice, de Broglie wavelength, relativistic effects, Ewald Sphere construction, elastic scattering, Cu Kalpha X-ray, indexing diffraction patterns, crystallographic phases, and Bravais lattice determination.
E N D
Electron diffraction Øystein Prytz
Summary from last time θ Reciprocal lattice of FCC structure is BCC
Wave nature of electrons • Wavelength of the electrons determined by the de Broglie formula: • Electrons accellerated in 200 kV potential travel at ~0.7c, need to consider relativistic effects:
Electron diffraction from polycrystalline sample Electron source e- Polycrystalline sample Detector/film/screen
Basic architecture of a TEM Electron source Electron beam Specimen Electromagnetic lenses Viewing screen
The Ewald Sphere (’limiting sphere construction’) Elastic scattering: k’ k The observed diffraction pattern is the part of the reciprocal lattice that is intersected by the Ewald sphere g
The Ewald Sphere is flat (almost) Cu Kalpha X-ray: = 150 pm => small k Electrons at 200 kV: = 2.5 pm => large k
Film plate Camera constant R=L tan2θB ~ 2LsinθB 2dsinθB =λ ↓ R=Lλ/d
(h2k2l2) Indexing diffraction patterns The g vector to a reflection is normal to the corresponding (h k l) plane and IgI=1/dnh nk nl • Measure Ri and the angles between • the reflections • - Calculate di , i=1,2,3 (=K/Ri) • Compare with tabulated/theoretical • calculated d-values of possible phases • Compare Ri/Rj with tabulated values for • cubic structure. • g1,hkl+ g2,hkl=g3,hkl (vector sum must be ok) • Perpendicular vectors: gi● gj = 0 • Zone axis:gi x gj=[HKL]z • All indexed g must satisfy: g ● [HKL]z=0 Orientations of corresponding planes in the real space
27o 50 nm 15o 10o 0o Determination of the Bravais-lattice of an unknown crystalline phase Tilting series around common axis
011 111 001 101 [101] [011] 010 110 100 c b a Bravais-lattice and cell parameters [100] d = L λ / R