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National Sun Yat-sen University Embedded System Laboratory. On-Chip SOC Test Platform Design Based on IEEE 1500 Standard. Presenter : Hong-Wei Zhuang. Kuen -Jong Lee, Tong-Yu Hsieh, Ching -Yao Chang,Yu -Ting Hong, and Wen-Cheng Huang.

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national sun yat sen university embedded system laboratory

National Sun Yat-sen University Embedded System Laboratory

On-Chip SOC Test Platform Design Based

on IEEE 1500 Standard

Presenter: Hong-Wei Zhuang

Kuen-Jong Lee, Tong-Yu Hsieh, Ching-Yao Chang,Yu-Ting Hong, and Wen-Cheng Huang

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (Volume:18 , Issue: 7 )

  • IEEE 1500 Standard defines a standard test interface for embedded cores of a system-on-a-chip (SOC) to simplify the test problems. In this paper we present a systematic method to employ this standard in a SOC test platform so as to carry out on-chip at-speed testing for embedded SOC cores without using expensive external automatic test equipment. The cores that can be handled include scan-based logic cores, BIST basedmemory cores, BIST-based mixed-signal devices, and hierarchical cores. All required test control signals for these cores can be generated on-chip by a single centralized test access mechanism (TAM) controller. These control signals along with test data formatted in a single buffer are transferred to the cores via a dedicated test bus, which facilitates parallel core testing.
abstract cont
  • A number of design techniques, including on-chip comparison, direct memory access, hierarchical core test architecture, and hierarchical test bus design, are also employed to enhance the efficiency of the test platform. A sample SOC equipped with the test platform has been designed. Experimental results on both FPGA prototyping and real chip implementation confirm that the test platform can efficiently execute all test procedures and effectively identify potential defect(s) in the target circuit(s).
what is the problem
What is the Problem
  • As SOC designs become more and more complex, requirements for ATE to accurately and efficiently test various types of cores have drastically increased the SOC test cost.
  • external automatic test equipment (ATE)
    • provide test stimuli as well as collect test responses through chip I/O pins
related work
Related work

require extensive use of external automatic

test equipment (ATE) [4],[5],[6]

using pure software


usually difficult to achieve high fault converge

increased the SOC test cost

core is wrapped by an IEEE 1500 wrapper


using software together with some extra hardware


On-Chip SOC Test Platform Design Based

on IEEE 1500 Standard

proposed method
Proposed method
    • TAMC : a test access mechanism controller
    • TAPC : a test access port controller (TAPC) for each

1500 core

soc test platform
SOC test platform
  • test platform generates a set of control signals that can be shared by 1149.1 and 1500 standards so as to reduce the extra area overhead.
  • test bus can be specially configured in a multiple-level hierarchy so as to reduce the loading of the test bus.
  • TAMC provides a parallel-to-serial mechanism to deliver test patterns from memory to scan chains of cores and a serial-to-parallel mechanism to transfer the test results from the cores to the TAMC
test access mechanism controller tamc
  • Control Unit
    • TAMC according to the setup information provided by the embedded processor and issues proper signals for test control.
  • Memory Access Unit
    • This unit generates the addresses for the memory to be accessed via a number of counters
  • Wrapper Control Unit
    • This unit generates the control signals for each wrapper according to the setup information stored in the internal data registers of the TAMC.
  • Comparator
    • An XOR-based comparator is designated to verify test results in TAMC
  • Shift Buffers
    • Due to the format difference between the data obtained
      • parallel-in-serial-out operations for test pattern application
      • serial-in-parallel-out operations for test response collection
supported test modes
  • Scan-Based Testing
  • Hierarchical Testing
  • Memory BIST
before the experiment
Before the Experiment
  • Area overhead
  • Test time
  • Compare with other methods
area overhead
Area Overhead
  • The wrappers require 3.721% of the processor and core
  • The test platform requires additional 1.384%
test time
Test time
  • All test operations are completed with 712 697 test cycles, which is only approximately 0.009 s when the system clock runs at 80 MHz
  • at-speed testing is achieved
  • no extra test pins are required
  • no signal distortion problem exists through chip I/O pins
  • the requirement of external ATE is minimized
  • carry out all core test procedures
  • test control signals can be generated on-chip
  • test buffers can be shared by all cores
  • Hierarchical core testing can be supported
  • test bus loading problem can be resolved
  • both static and dynamic parameter analyses for analog or mixed-signal devices can be done on-chip.
my comment
My Comment
  • This paper help me known that SOC test platform
  • We can faster to test on chip SOC than before