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This module discusses fundamental principles of computer architecture, focusing on evolving technology trends and performance metrics. Key topics include Moore's Law, market segmentation, and the implications of hardware scalability. The lecture covers important metrics like cost, yield, fault tolerance, and power efficiency. In specific, it reviews the historical shifts in computing from mainframes to embedded systems, addressing design challenges like ISA development and quantitative design principles. The session sets the stage for deeper exploration of instruction set architecture in subsequent discussions.
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Computer Architecture PrinciplesDr. Mike Frank CDA 5155Summer 2003 Module #4 Market & Technology Trends
Upcoming Material • H&P chapter 1 - Fundamentals: Performance, quantitative design. • Technology trends, 1st-order scaling laws • Cost, yield, and fault-tolerance • Performance measurement and benchmarks • Quantitative design • Generalized Amdahl’s law • Next: Begin ISA design (ch. 2).
H&P Chapter 1:Fundamentals of Computer Design • 1.1. Introduction • 1.2. The Changing Face of Computing • 1.3. Technology Trends • 1.4. Cost, Price, and Their Trends • 1.5. Measuring & Reporting Performance • 1.6. Quantitative Princ. of Computer Design • 1.7. Performance & Price-Performance • 1.8. Power Consumption & Efficiency • 1.9-1.11 End material
1.1. Introduction Key points to remember (from lecture 1): • General Moore’s Law trend in recent decades: • Computer performance increases @ ~50% per year • Reflects improvements in raw Si transistor ops/sec/chip • Continuing architectural innovations generally required to harness improving raw parallel HW performance for faster performance on old serial ISAs. • Eventually, serial programming models may hit a wall. • Someday, different programming models may be introduced that scale up more easily with technology improvements.
Raw technologyperformance (gate ops/sec/chip):Up ~55%/year Microprocessor Performance Trends
1.2. The Changing Face of Computing Key points: • Historical evolution of industry dominance: • mainframes minicomputers PCs • Now, 3 distinct major markets: desktop, server, embedded • Different requirements for each • Each uses commodity microprocessors • Task of the computer designer • ISA, organization, microarchitecture, hardware
Major Market Segments • Desktop Computing • ~$1,000 PCs to $10,000 Workstations • Critical metric: Price-performance (esp. graphics) • performance per unit price, drives leading-edge • Servers • ~$10K to $1M • Availability, scalability & throughput critical • Embedded Systems • $1 (toy) to $100,000 (network router) • Real-time, application-specific performance • Small memory footprint, low power
Embedded Solutions • Common solutions for custom hardware: • ASIC (Application-Specific Integrated Circuit) • Custom VLSI chips integrated from standard cells • FPGA (Field-Programmable Gate Array) • Custom circuits dynamically loaded from firmware • Many embedded systems are mostly just SW running on one or more of: • On-chip embedded processor core • e.g. MIPS, ARM, etc. • COTS embedded processor • Commercial Off-The-Shelf, usu. a packaged chip • DSPs (Digital Signal Processor) • A microprocessor specialized for signal-processing tasks
1.3. Technology Trends Key points: • Different rates of improvement in different components affect architectural decisions. • E.g., electrical buses vs. optical switches on board • Scaling of transistors, wires, power • Local connectivity, low power increasingly favored
Technology Scaling: Notation • Historically, device feature length scales have decreased by ~12%/year. • So: feature length 0.88year : • 1/length (1/0.88)year1.14 year : (up 14%/year) • Meanwhile, typical die diameters have increased by ~2.3%/year. • Diameter 1.023year : • 1/Diameter
Some 1st-order Semiconductor Scaling Laws • Voltages V (due to punch-through effects) • Long-term: • Temperature T? (prevents leakage) • Resistance: • Fixed-shape wire: R l/wt / = • Thin cross-chip wire: R / = • Capacitance: • Fixed-shape structure: C lw/s / = • Per unit wire length: C 1 (constant) • Cross-chip wire: C • Per unit area: C 1/s
Charges & Currents • Charges & fields: • Charge on a structure: Q = CV • Surface charge density: Q/A 1 • Electric field strengths: E = V/l 1 • Currents: • Peak current densities: J = E/ 1 • Peak current in a wire: I = JA • Channel-crossing times: t=l/v (v 200 kmph) • Current in an on-transistor: I = Q/t / = • Effective on-resistance: R = V/I / = 1 Or faster w.strained Si 5-25 kΩ typical
Delay Scaling • Charging time delay t RC : • Through fixed shape conductor: RC = 1 • Via cross-die thin wire: RC · = up 50%/yr! • Through a transistor: RC 1· = • Implications: • Transistors increasingly faster than long thin wires. • Even becoming faster than fixed-shape wires! • Local communication among chip elements is becoming increasingly favored!
Performance scaling • Performance characteristics: • Clock frequency for small, transistor-delay-dominated local structures: f 1/t (up 14%/yr) • Transistor density (per area): d = 1/ = • Chip area: A • Total raw performance (local transitions / chip / time): R = fd A = = 1.55year • Up 55%/year! • Nearly doubles every 18 months (Moore’s Law).
Energy and Power • Energy: • Energy on a given structure: E CV2 2 = 3 • Energy per-area: EA CV2/A 3/2 = • Energy densities: EA/thickness / 1 • Per-area power: PA = EAf = 1 • Power per die: P = PAA (up ~5%/year)