1 / 11

Power/Ground Pin Parasitic for SSN Simulations - A Literature Review-

Power/Ground Pin Parasitic for SSN Simulations - A Literature Review-. Ambrish Varma akvarma@ncsu.edu. August 2005. Simultaneous Switching Ground Noise Calculation for Packaged CMOS Devices. R. Senthinathan and J. L. Prince

alda
Download Presentation

Power/Ground Pin Parasitic for SSN Simulations - A Literature Review-

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Power/Ground Pin Parasiticfor SSN Simulations -A Literature Review- Ambrish Varma akvarma@ncsu.edu August 2005

  2. Simultaneous Switching Ground Noise Calculation for Packaged CMOS Devices R. Senthinathan and J. L. Prince 1724 IEEE JOURNAL OF SOLID-STATE CIRCUITS, VOL. 26, NO. 11, NOVEMBER 1991 http://ieeexplore.ieee.org/iel1/4/3123/00098995.pdf?arnumber=98995

  3. Electrical Packaging Requirements for Low-Voltage ICs-3.3 V High-Performance CMOS Devices as a Case Study Ramesh Senthinathan,Arun Mehra, Mali Mahalingam, Yutaka Doi, and Hector Astrain IEEE TRANSACTIONS ON COMPONENTS, PACKAGING, AND MANUFACTURING TECHNOLOGY-PART B, VOL. 17, NO. 4, NOVEMBER 1994 http://ieeexplore.ieee.org/iel4/96/7951/00338714.pdf?arnumber=338714

  4. Accurate Simultaneous Switching Noise Estimation Including Velocity- Saturation Effects Srinivasa R. Vemuru, IEEE TRANSACTIONS ON COMPONENTS, PACKAGING, AND MANUFACTURING TECHNOLOGY-PART B, VOL. 19, NO. 2, MAY 1996 http://ieeexplore.ieee.org/iel4/96/10657/00496038.pdf?arnumber=496038

  5. Estimation of Ground Bounce Effects on CMOS Circuits Adnan Kabbani and Asim J. Al-Khalili IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGY, VOL. 22, NO. 2, JUNE 1999 http://ieeexplore.ieee.org/iel5/6144/16812/00774752.pdf?tp=&arnumber=774752&isnumber=16812

  6. Simultaneous Switching Noise (SSN) Modeling Bernhard Unger 1/31/00 EIA IBIS Summit http://www.industry.siemens.de/itps/eda/download/ibis_summit200.pdf

  7. Analysis and Optimization of Ground Bounce in Digital CMOS Circuits Payam Heydari and Massoud Pedram IEEE International Conference on Computer Design (ICCD), Austin, Texas, Sept. 2000. http://newport.eecs.uci.edu/~payam/ICCD2000.pdf

  8. Estimation of On-Chip Simultaneous Switching Noise in VDSM CMOS Circuits Kevin T. Tang and Eby G. Friedman Proceedings of the International Conference on Modeling and Simulation of Microsystems, 2000 http://www.nsti.org/publ/MSM2000/T31.03.pdf

  9. Noise Generation and Coupling Mechanisms in Deep-Submicron ICs Xavier Aragonès, Jose Luis González, Francesc Moll, and Antonio Rubio Universitat Politècnica de Catalunya IEEE Design & Test of Computers. September–October 2002 http://ieeexplore.ieee.org/iel5/54/22200/01033789.pdf?arnumber=1033789

  10. Simultaneous Switching Noise in On-Chip CMOS Power Distribution Networks Kevin T. Tang and Eby G. Friedman, Fellow, IEEE IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, VOL. 10, NO. 4, AUGUST 2002 http://ieeexplore.ieee.org/iel5/92/26443/01177355.pdf?tp=&arnumber=1177355&isnumber=26443

  11. Analyzing Internal-Switching Induced Simultaneous Switching Noise Li Yang, J. S. Yuan Proceedings of the Fourth International Symposium on Quality Electronic Design (ISQED’03) http://ieeexplore.ieee.org/iel5/8500/26872/01194768.pdf?tp=&arnumber=1194768&isnumber=26872

More Related