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Handout. Previous knowledge. Digital electronicsMicro electronic circuitsElectronic devices. Objective. VLSI circuit design and verificationSilicon implementationUsage of EDA tools. Goals of this Course. Learn to design and analyze state-of-the-art digital VLSI chips using CMOS technologyUnderstand design issues at the layout, transistor, logic and register-transfer levelsPerformance analysis and optimizationUse commercial design software in the labComplexity managementUnderstand the co9454
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1. Analog Digital VLSI Designhttp://discovery.bits-pilani.ac.in/discipline/eee/agupta/advd/advd.htm
2. Handout
7. Previous knowledge Digital electronics
Micro electronic circuits
Electronic devices
8. Objective VLSI circuit design and verification
Silicon implementation
Usage of EDA tools
9. Goals of this Course Learn to design and analyze state-of-the-art digital VLSI chips using CMOS technology
Understand design issues at the layout, transistor, logic and register-transfer levels
Performance analysis and optimization
Use commercial design software in the lab
Complexity management
Understand the complete design flow
10. VLSI DESIGN
11. What is VLSI design? A way to design electronic circuits
Dimensionally –micron, submicron, nano range
12. Why VLSI imp? Current day technology
Micro electronics creeping in all disciplines--- (merger of various disciplines in system design)
Bio medical/ health—brain mapping, artificial intelligence
Electromechanical systems—robotics
Communication,
Smart and secure homes,
Identification , vehicular electronics, process control
13. Uniqueness of VLSI Design HIGH INTEGRATION DENSITY
INTERCONNECT CROSS TALK,
MISMATCH (ON CHIP, DIE TO DIE),
COMPLEX DESIGNS,
DESIGN VERIFICATION & TESTABILITY
DESIGN RULES
are important design issues now
FAST CHANGING TECHNOLOGY
PORTING DESIGN TO NEW TECH GENERATION ,
NEW SET OF DESIGN RULES –make design indep. of design rules
leverage existing work: programs ,building blocks
14. Design Strategies Design is a continuous tradeoff to achieve performance specs with adequate results in all the other parameters.
Design Parameters By Which Design Success Is Measured:
Performance Specs - function, timing, speed, power
Size of Die - manufacturing cost
Time to Design - engineering cost and schedule
Ease of Test Generation & Testability - engineering cost, manufacturing
cost, schedule
Manufacturability - resilient to circuit/process variabilities
16. VLSI design flow--Y chart (D.GJASKI)
19. VLSI Design Styles Programmable Logic Devices
Programmable Logic Device (PLD)
Field Programmable Gate Array (FPGA)
Gate Array
Standard Cell (Semi-Custom Design)
Full-Custom Design
20. IMPACT OF DIFFERENT VLSI DESIGN STYLES ON DESIGNCYCLE TIME AND ACHIEVABLE CHIP PERFORMANCE
21. PERFORMANCE IMPROVEMENT OF A VLSI PRODUCT FOR EACH NEW GENERATION OF MANUFACTURING TECHNOLOGY
22. Analog Design Only Full custom
Fully handcrafted design
Each design requires specific performance
Limited automation possible
Lack of Automation supporting CAD tools
23. DIGITAL CMOS CHIP DESIGN OPTIONS
24. Field Programmable Gate Array (FPGA)
25. Introduction User / Field Programmability.
Array of logic cells connected via routing channels.
Special I/O cells.
Logic cells are mainly lookup tables (LUT) with associated registers.
Interconnection on SRAM basis or antifuse elements.
28. XC4000E Configurable Logic Blocks 2 Four-input function generators (Look Up Tables)
- 16x1 RAM or
Logic function
2 Registers
- Each can be
configured as Flip
Flop or Latch
- Independent
clock polarity
- Synchronous and
asynchronous
Set/Reset
29. Look Up Tables
Combinatorial Logic is stored in 16x1 SRAM Look Up Tables (LUTs) in a CLB
Example:
30. XC4000X I/O Block Diagram
31. Xilinx FPGA Routing 1) Fast Direct Interconnect - CLB to CLB
2) General Purpose Interconnect - Uses switch matrix
32. Design Flow
33. Gate Array
34. Gate Array In view of the fast prototyping capability, the gate array (GA) comes after the FPGA.
Design implementation of
FPGA chip is done with user programming,
Gate array is done with metal mask design and processing.
Gate array implementation requires a two-step manufacturing process:
The first phase, which is based on generic (standard) masks, results in an array of uncommitted transistors on each GA chip.
These uncommitted chips can be customized later, which is completed by defining the metal interconnects between the transistors of the array
36. Channeled vs. Channel-less (SoG) Approaches
37. Small Section of a Semi-custom Base Array Without Interconnect
38. Section of Semi-custom Array with Single Level Metal Interconnect
39. The GA chip utilization factor is higher than that of FPGA.
The used chip area divided by the total chip area.
Chip speed is also higher.
More customized design can be achieved with metal mask designs.
Current gate array chips can implement as many as hundreds of thousands of logic gates.
40. Standard Cell Based DesignCBIC
41. CBIC One of the most prevalent custom design styles.
Also called semi-custom design style.
Requires development of a full custom mask set.
Basic idea:
All of the commonly used logic cells are developed, characterized, and stored in a standard cell library.
A typical library may contain a few hundred cells including inverters, NAND gates, NOR gates, complex AOI, OAI gates, D-latches, and flip-flops.
42. Characteristic of the Cells Each cell is designed with a fixed height.
To enable automated placement of the cells, and
Routing of inter-cell connections.
A number of cells can be abutted side-by-side to form rows.
The power and ground rails typically run parallel to the upper and lower boundaries of the cell.
Neighboring cells share a common power and ground bus.
nMOS transistors are located closer to the ground rail while the pMOS transistors are placed closer to the power rail.
The input and output pins are located on the upper and lower boundaries of the cell.
43. Standard Cells
44. Standard Cell Layout
45. Floor-plan for Standard Cell Design Inside the I/O frame which is reserved for I/O cells, the chip area contains rows or columns of standard cells.
Between cell rows are channels for dedicated inter-cell routing.
Over-the-cell routing is also possible.
The physical design and layout of logic cells ensure that
When placed into rows, their heights match.
Neighboring cells can be abutted side-by-side, which provides natural connections for power and ground lines in each row.
47. Full Custom Design
48. Introduction The standard-cells based design is often called semi custom design.
The cells are pre-designed for general use and the same cells are utilized in many different chip designs.
In the full custom design, the entire mask design is done anew without use of any library.
The development cost of such a design style is prohibitively high.
The concept of design reuse is becoming popular in order to reduce design cycle time and cost.
49. Contd. The most rigorous full custom design can be the design of a memory cell.
Static or dynamic.
Since the same layout design is replicated, there would not be any alternative to high density memory chip design.
For logic chip design, a good compromise can be achieved by using a combination of different design styles on the same chip.
Standard cells, data-path cells and PLAs.
50. In real full-custom layout in which the geometry, orientation and placement of every transistor is done individually by the designer,
Design productivity is usually very low.
Typically 10 to 20 transistors per day, per designer.
Full-custom layout
51. Continued In digital CMOS VLSI, full-custom design is rarely used due to the high labor cost.
Exceptions to this include the design of high-volume products such as memory chips, high-performance microprocessors and FPGA masters.
Next slide shows the full layout of the Intel 486 ?P chip.
Good example of a hybrid full-custom design.
53. Small Section of a Typical Full Custom Layout
54. Comparison Among Various Design Styles
55. Design quality ACHIEVE SPECIFICATIONS (Static & Dynamic)
DIE SIZE
POWER DISSIPATION
TESTABILITY
YIELD AND MANUFACTURABILITY
RELIABILITY
TECHNOLOGY UPDATABLE
56. -> TESTABILITY
+ generation of good test vectors
+ availablity of reliable test fixture at speed
+ design of testable chip
-> YIELD AND MANUFACTURABILITY
+ functional yield
+ parametric yield Contd.
57. Contd. ->RELIABILITY
+ premature aging (Infant mortality)
+ ESD/EOS
+ latchup
+ on-chip noise and crosstalk
+ power and ground bouncing
->TECHNOLOGY UPDATABLE
+ Easily updated to new design rules
58. Some other important issues Highly complex design--- structured design strategies
Packaging
60. Structured Design Strategies Strategies common for complex hardware and software projects.
-> Hierarchy: Subdivide the design into many levels of sub-modules
-> Modularity: Define sub-modules unambiguously & well defined interfaces
-> Regularity: Subdivide to max number of similar sub-modules at each level
-> Locality: Max local connections, keeping critical paths within module boundaries
61. Regularity Design the chip hierarchy into identical or similar modules
Extended use of a single design simplifies the design process
Regularity can exist at all levels of design hierarchy
Circuit Level: uniform transistor sizes rather than manually optimizing each device.
Logic Level: identical gate structures rather than customize every gate.
Architecture Level: construct architectures that use a number of identical processor structures
62. Modularity ADDS TO HIERARCHY AND REGULARITY THE QUALITIES OF
WELL DEFINED FUNCTIONS AND INTERFACES
-> Unambiguous functions
-> Well defined behavioral, structural, and physical interfaces
-> Enables modules to be individually designed and evaluated.
63. Locality TIME LOCALITY: modules see a common clock and synchronous timing is applied.
Robust clock generation and distribution is critical
Critical paths, where possible, are to be kept within module boundaries
Any global module to module signal should have an entire clock cycle to traverse the chip.
Replicate logic, if necessary, to alleviate cross-chip crossings.
Locate modules in layout to minimize large or "global" routes between modules.
64. Design for manufacturability Design goal: All fabricated circuits meet all performance specs under all
operating conditions.
Impediments:
Random variations in fabrication process.
Random variations in operating conditions, e.g. VDD, Tambient.
65. Reality: Excessive deviations of performance cause yield loss and increase the
unit cost of the chip.
Why DFM important?
66. DFM Issues:
1. Parametric yield estimation.
2. Parametric yield maximization.
3. Worst-case analysis.
4. Variability Minimization.
67. DFM DFM Practice:
Consider the effects of expected randomness in processing and operating conditions early in the design process.
Circuit made as insensitive to these variations as is practical.
Design to performance specs with sufficient margins that a large fraction of the manufactured chips pass the chip acceptance criteria.
68. Packaging Technology Include important package related parasitics in the chip design and simulation
Package Power & Ground Planes
On-chip power and ground busses
Bond Wire Lengths -> on-chip inductive effects
Thermal Resistance -> temp rise due to on-chip power dissipation
Package Cost
69. Important package design concerns: hermetic seals to prevent penetration of moisture
thermal conductivity
thermal expansion coefficient
pin density
parasitic inductance and capacitance
alpha-paricle protection (memories)
70. Package types
72. Custom integration An integrated circuit that requires a full set of masks specifically designed for a particular function or application.
A custom IC is usually developed for a specific customer and may have to withstand harsh environments .
73. Why consider custom integration? There are a number of reasons why developing a custom Integrated Circuit is an appropriate and often essential ingredient to the development of a successful product
74. Reasons Size. The continued market demand to reduce the size of electronic devices, in particular portable and hand-held devices, requires ever higher levels of integration. Replacing functions requiring the use of a number of discrete components with one IC helps achieve this goal.
75. Contd. Performance. By utilizing the superior matching and tracking characteristics of integrated circuit components, manual adjustment of circuit parameters can often be eliminated, while maintaining tighter spread on key system performance specs over the full range of operating conditions. Additionally, critical or high-precision specs can be trimmed at wafer test.
76. Contd. Cost. Replacing a number of discrete components with a pre-tested IC significantly reduces the test time and the number of rejects. For large production quantities the initial development cost will be amortized in a short period of time, resulting in a lower cost per unit.
77. Contd. Reliability. An IC is significantly more reliable than a PCB populated with the devices necessary to provide the equivalent functionality using discrete components or multiple IC's.
78. Contd. Copy protection. This can be the most important incentive to consider custom integration. Simple hardware copying is prevented because of the exclusivity of the custom IC.
79. What are the fab. technology options? The three principal technologies which are readily accessible for custom integration are Biploar, CMOS and BiCMOS
Choice between using a prefabricated semi-custom array or undertaking a full custom development
80. CMOS processing N-WELL
P-WELL
TWIN-TUB
81. Wafer preparation defect free single crystalline lightly doped WAFER.
Metallurgical grade silicon-electronic grade silicon(99.99% pure)
Single crystalline structure obtained by melting and then cooling ---czochralski method
Ingot cut into wafers using diamond saw
Wafers are than polished to mirror finish
82. Process involved Photolithography
Deposition
Oxidation
Etching
Diffusion/ion implantation
83. General Principles Technology changes fast, so it is important to understand the general principles which would span technology generations
optimization, tradeoffs
work as part of a group
leverage existing work: programs ,building blocks
Concepts remain the same:
Example: relays -> tubes -> bipolar transistors -> MOS transistors