The “classical” confocal setup is characterized by an excellent lateral resolution and a very high signal-to-noise ratio but has the disadvantage of having a very small depth of focus, requiring vertical scanning.
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Non-contact measurement of distance and thickness along the Z axis
2d & 3D profilometry
High axial resolution (down to 2nm in distance mode along Z-axis)
Wide choice of measuring ranges (100 microns to 42mm range)
No need for vertical scanning while sample is in range
High repetition rate (up to 10kHz)
Allows measurements on steep slope (up to ±42 deg)
Works on any type of sample (transparent/opaque, polished/rough)
paper, fabrics, rubber, wood, polymer etc)
Insensitive to ambient light
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