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Variation immunity in sub-threshold operation

Variation immunity in sub-threshold operation. Patricia Gonzalez Divya Akella VLSI Class Project. Motivation : Sub-threshold Operation . Sub-threshold processor which runs on 180mV [1] Sub-threshold FPGAs A sub-VT ring oscillator at 80mV [2].

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Variation immunity in sub-threshold operation

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  1. Variation immunity in sub-threshold operation Patricia Gonzalez DivyaAkella VLSI Class Project

  2. Motivation : Sub-threshold Operation • Sub-threshold processor which runs on 180mV [1] • Sub-threshold FPGAs • A sub-VT ring oscillator at 80mV [2]. • A 65nm chip : 256kb memory in sub-threshold region to below 400mV [3] • New wireless applications : Wearable body sensor node (19uW) running on harvested energy – small devices, long lifetimes! Ultimate aim ? Reduce Power consumption!

  3. Variation In sub-threshold • Taken from [1] B. Calhoun • Issue : Meet Throughput • 100 operations every 5 seconds -> Frequency requirement

  4. Motivation : Yield • a critical obstacle : sensitivity of sub-threshold circuits to variations in process, voltage, and temperature (PVT) • Affects delay : limits product yield ! • A system that adjusts the chip operation to account for PVT ?

  5. Motivation : Razor • System should be able to run at multiple frequencies and voltages. • Design to ensure correct operation at all PVT variations. • Variations ? Environmental, local, global, voltage droops, even data dependent! • Razor approach : DVS based on dynamic detection of errors

  6. Motivation : PDVS • Voltage reduced to minimum voltage possible. • Headers allow to dither between voltages. • Different energies for different modes of operation/workload!

  7. The Problem • First “high” input is caught by the flop : seen at output Q • Second “high” input is missed ?

  8. Test circuit • To experiment with this problem : chose a 3 bit adder • Output is shown to be flopped

  9. Solution • Shadow latch • Error comparator

  10. Waveform

  11. System

  12. Overhead ? • Power consumption of razor circuit : • Worst case (FF) corner power at 0.4 V = 1.4 nW • Further optimization is definitely possible! • Use of razor circuit only for critical paths

  13. Design • Typically – corner analysis to select a supply voltage ? • Extra margin for worst case scenario! • What if variability is rare , what if it never occurs ? • In lower processes and sub – threshold , variability might be so much – voltage margins go up! • Optimization during circuit design can now be done for a typical case • We attempt to show use of razor in sub-threshold voltages.

  14. Savings example (T = 20C) V (3 freqof operation) % savings 0.4 31.81% 0.425 21.99% 0.45 14.21% 0.475 0.5 38.21% 0.55 25.49% 0.6 18.32% 0.65 0.7 42.49% 0.8 29.24% 0.9 15.08% 1

  15. A Perspective of Yield • Variable voltage and frequency to adjust to variation • It will improve the efficiency, thereby increasing yield and lowering costs. • Achievable performance for a given energy budget • Improve yield at a given frequency by allowing slower chips to speed up by going to higher VDD • Yield against process variation !!

  16. 40 MHz 200 kHz 100 kHz

  17. References [1] Wang, A.; Chandrakasan, A.; , "A 180mV FFT processor using subthreshold circuit techniques," Solid-State Circuits Conference, 2004. Digest of Technical Papers. ISSCC. 2004 IEEE International , vol., no., pp. 292- 529 Vol.1, 15-19 Feb. 2004 2] B. H. Calhoun and A. Chandrakasan, “Characterizing andModeling Minimum Energy Operation for Subthreshold Circuits,” in ISLPED, 2004, pp. 90–95. [3] B. Zhai, et al., “Theoretical and Practical Limits of Dynamic Voltage Scaling,” in DAC, 2004, pp. 868–873. [4] Dan Ernst, Tao Phan. Razor : A low power pipeline based on Circuit Level timming speculation. [5] Mathias Eireiner,. In situ Delay Characterization and Local Supply voltage adjustment for compensation of local parameter variations.

  18. Gate leakage based timer : • Intended to use it as a clock source • Did not integrate into the system • Originally, used as a timer in the sub – Hz range • Gate leakage based system – variation with temperature is reduced • Found that with varying capacitance charging time, leakage transistors and Schmitt trigger design – higher frequency ranges can be obtained. Voltage Time period Frequency 0.4 3.71E-07 2.70E+06 0.5 5.65E-08 1.77E+07 0.6 1.40E-08 7.16E+07 0.7 5.16E-09 1.94E+08 0.8 2.54E-09 3.94E+08 0.9 1.54E-09 6.48E+08 Can be used as an unstable source of clock on chip, with possible caliberation with a stable clock source.

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