'Wafer test' presentation slideshows

Electronics for the LHCb Outer Tracking Detector

Electronics for the LHCb Outer Tracking Detector. Dirk Wiedner Physics Institute University of Heidelberg Germany. Tracking: Impact measurement. LHCb. CERN Switzerland. Outer Tracker. Ionising particle. 200 ? m resolution. TFC ECS. HV. L1. LV. TFC. TFC. ECS. ECS.

415 views • 31 slides

The Past and Future of WRTLT

415 views • 29 slides

First Wafer Results from Aptasic

First Wafer Results from Aptasic. Vladimir Zivkovic NIKHEF. FE-I4 testing meeting Amsterdam, January 9-th 2012. Test Development for Wafer Test in Industrial environment. Test patterns pre-verified at CERN on 4 boards with wire-bonded chips on Credence Sapphire platform,

308 views • 10 slides

Origin of Wafer Mapping - Kensington Laboratories

The map is a suitable representation of the variation in performance across the substrate, since the distribution of those variants may be a hint as to their cause. The concept also comprises the package of data produced by modern wafer testing equipment which can be conveyed to equipment used for ensuring 'back-end' manufacturing processes.

17 views • 1 slides