'Radiation test' presentation slideshows

ALCT and TMB Status

ALCT and TMB Status. Martin von der Mey University of California Los Angeles ALCT production status TMB status TMB radiation test RAT status. ALCT384 Boards. Power, computer connectors. 80 MHz SCSI outputs (to Trigger Motherboard ). Xilinx Mezz. board. 24 Input signal connectors.

382 views • 26 slides

HV MUX motivation and principle HV MUX devices requirements Real time test system and test results

444 views • 26 slides

Muon System Summary

Muon System Summary. Dick Loveless University of Wisconsin. Upgrade Workshop. 10 November 2011. DT Upgrade plans. PHASE 1 (2013-2014) * Replacement of theta TRB (Trigger boards) * Relocation of Sector Collector from the cavern (UXC) to the counting room (USC).

266 views • 26 slides

PRR on Patch-Panel ASIC 9 Dec. 2002 KEK SOS

PRR on Patch-Panel ASIC 9 Dec. 2002 KEK SOS. Overview LVDS Rx Variable Delay BCID Test Pulse Generator Control Radiation tests Mass-production and inspection. Overview. Requirements Receives LVDS differential signals from two ASD Boards (2 x 16-ch) BCID

332 views • 23 slides

Student Meeting Jose Luis Sirvent PhD. Student 03/07/2014

Fifth International Workshop on Analogue and Mixed-Signal Integrated Circuits for Space Applications 2014 (Review): AMICSA_2014 Review. Student Meeting Jose Luis Sirvent PhD. Student 03/07/2014. AMICSA 2014 Review.

376 views • 19 slides

Availability Analysis of Xilinx FPGA on Orbit

Availability Analysis of Xilinx FPGA on Orbit. Nozomu Nishinaga National Institute of Information and Communications Technology Masayoshi Yoneda NEC TOSHIBA Space Systems, Ltd. Outline. Motivation Heavy Ion test results of Virtex II pro Availability analysis Conclusion. Motivation.

378 views • 16 slides

Availability Analysis of Xilinx FPGA on Orbit

Availability Analysis of Xilinx FPGA on Orbit. Nozomu Nishinaga National Institute of Information and Communications Technology Masayoshi Yoneda NEC TOSHIBA Space Systems, Ltd. Outline. Motivation Heavy Ion test results of Virtex II pro Availability analysis Conclusion. Motivation.

180 views • 16 slides

SMOV4 Update: ACS Status

David Golimowski (TIPS/JIM 16 Jul 2009). Outline. SMOV4 Update: ACS Status. Summaries of Functional Test and Optimization Campaign WFC and SBC Performance and Characteristics Implications of SI C&DH Anomaly (HSTAR 11880) Assessment of Day 174 Suspend (HSTAR 11895)

267 views • 13 slides

LHC Power Converters & Radiation

LHC Power Converters & Radiation. What can we expect during commissioning ?. T. Wijnands TS/LEA. Origin of Radiation in LHC. Beam loss. Decay activated material. Radiation levels - global distribution. ARC. DS. RR. Proton - residual gas. Proton - point losses.

220 views • 12 slides

Silicon Testing at KSU

Silicon Testing at KSU. Sergey Korjenevski Kansas State University 06/18/2002 (11 slides total). Outline. Prototype Availability Prototype properties (IV-CV measurements) QA Procedure Radiation Test Preparation Documentation web page Manpower. Stock.

206 views • 12 slides

A Serializer ASIC for High Speed Data Transmission in Cryogenic and HiRel Environment

A Serializer ASIC for High Speed Data Transmission in Cryogenic and HiRel Environment. Tiankuan Liu On behalf of the ATLAS Liquid Argon Calorimeter Group Department of Physics, Southern Methodist University Dallas, Texas 75275, USA liu@physics.smu.edu. Outline. Introduction

197 views • 12 slides

Plan for 2009 activity

Plan for 2009 activity. S. Uozumi and All Dec-14 2009 ScECAL meeting @ KEK. Beam Test. DESY BT analysis (Satoru) KEK BT analysis (Nishiyama) FNAL BT analysis Nishiyama, Sakuma, Adil FNAL BT data taking everyone. MPPC related. Improve performance with Hamamatsu

140 views • 5 slides

Neutron damage of DSSDs

Neutron damage of DSSDs. Neutron irradiation. 5. Nakayama-san expects ~ 100 MeV neutrons However, the rate is still 10 11 /cm 2 /year! ~10 12 /cm 2 during Belle II lifetime! near the type inversion (but needs proper scaling...). Neutron background. Neutron energy is around 5MeV. 3.

150 views • 5 slides

Collaboration on 65nm technology and its rad tol

Collaboration on 65nm technology and its rad tol. Radiation tolerance. Characteristics to test Vt shifts, Leakage, noise, matching, g m,max , ? Many devices to radiation test: Different transistor sizes and layouts Normal Vt , High Vt , Zero Vt , Low Vt

139 views • 4 slides