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Manufactured product quality - PowerPoint PPT Presentation

Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage

Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage. Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849 http://www.eng.auburn.edu/~vagrawal

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398 views • 24 slides

Lecture 4 Yield Analysis & Product Quality

Lecture 4 Yield Analysis & Product Quality. Yield and manufacturing cost Clustered defect yield formula Yield improvement Defect level Test data analysis Example: SEMATECH chip Summary. VLSI Chip Yield.

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348 views • 15 slides

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Manufactured product quality - PowerPoint PPT Presentation

Effectiveness Measures for VLSI Testing: Defective Parts per Million, Defect Coverage and Fault Coverage

Lecture 4 Yield Analysis &amp; Product Quality

Lecture 4 Yield Analysis & Product Quality