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Test Circuit for Locating Open Leads of QFP ICs

Test Circuit for Locating Open Leads of QFP ICs. M.Hashizume, A.Shimoura, M.Ichimiya, H.Yotsuyanagi The Univ. of Tokushima, JAPAN. Outline. Background Our targeted problem: =open lead location of CMOS QFP ICs Our test method Our test circuit and the design method

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Defect free circuit - PowerPoint PPT Presentation

Test Circuit for Locating Open Leads of QFP ICs