EE 587 SoC Design & Test. Partha Pande School of EECS Washington State University [email protected] BOUNDARY SCAN. Motivation for Standard. Bed-of-nails printed circuit board tester gone We put components on both sides of PCB & replaced DIPs with flat packs to reduce inductance
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Get snapshot of normal chip input/output signals
Put data on bound. scan chain before next instr.
(4 bits)Device ID Register --JEDEC Code
OptionalOptional / Required Instructions