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Séminaire DRT/LIST 08/09/08 SACLAY.

Ongoing R&D in Orsay/Saclay on ps time measurement: a USB-powered 2-channel 3.2GS/s 12-bit digitizer D.Breton (LAL Orsay), E.Delagnes (CEA/IRFU). Séminaire DRT/LIST 08/09/08 SACLAY. The SAM (Swift Analog Memory) chip. 2 differential channels 256 cells/channel BW > 450 MHz

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Séminaire DRT/LIST 08/09/08 SACLAY.

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  1. Ongoing R&D in Orsay/Saclay on ps time measurement: a USB-powered 2-channel 3.2GS/s 12-bit digitizerD.Breton (LAL Orsay), E.Delagnes (CEA/IRFU) Séminaire DRT/LIST 08/09/08 SACLAY.

  2. The SAM (Swift Analog Memory) chip • 2 differential channels • 256 cells/channel • BW > 450 MHz • Sampling Freq 400MHz->3.2GHz • High Readout Speed > 16 MHz • Smart Read pointer (integrates a 1/Fs step TDC) • Few external signals • Many modes configurable by a serial link. • Auto-configuration @ power on • AMS 0.35 µm => low cost for medium size prod NIM A, Volume 567, Issue 1, p. 21-26, 2006 6000 ASICs manufactured, tested and delivered in Q2 2007

  3. Principle of the SAMPLING MATRIX 1 amplifier/line Short DLL: less jitter Parallelized Readout Individual delay servo-control / column: stability

  4. The SAM-USB board Reference clock. Up to 200MHz => 3.2GS/s Power consumption < 2.5W Pulsers for reflectometry applications 1 GHz BW amplifier. 2 analog inputs. DC coupled µ USB Ext clk & Trigger inputs Dual 12-bit ADC SAM Chip Trigger comparators

  5. Test results: short pulse sampling 1ns FWHM pulse sampled @ 3.2GS/s (75mV) [mV] single shot 300ps/cell

  6. Fixed pattern jitter • DNL => modulo 16 pattern. Time step spread = 6.6 ps rms • INL => modulo 16 pattern + slow pattern. • “Absolute time” spread = 23 ps rms (100 ps peak-peak) • Seems to be the major part of the jitter. • Position correlated => could be corrected (off-chip) => TO BE DONE • Advantage of servo-controlled structure: very small dependence to time and temperature

  7. Random jitter • With random trigger: jitter floor ~ 2.5 ps rms but with larger jitter on “transition” samples (16 ps). Mean jitter ~ 5 ps • Understood: due to the clock jitter which can be seen only on the last cell of the DLLs • Source is unknown yet: could be the board (FPGA) or the chip • Next board will have a direct connection between oscillator and SAM to farther study this problem.

  8. Recording of a MCPPMT pulse in Jerry’s lab ~ -1V 1.25 ns / div • Unfortunately, the board was equipped with a 100 MHz oscillator => the wave was sampled at only 1.6 GHz!

  9. R&D on a ps TDC in IBM 130nm technology • We are collaborating to the design of a new TDC in the IBM 130nm technology • This is a collaboration between Orsay, Saclay, and the University of Chicago (with the help of Gary Varner). • The goal is to reach the ps precision thanks to the addition to an usual DLL based TDC of analog memories sampling at very high frequency (10 to 40GS/s). • Input clock frequency should be 312.5 MHz • We started designing the first prototype • main characteristics are almost fixed now • It should include a complete measurement channel • In the near future, we aim at building a 16-channel chip with integrated output buffers. • These chips will be used at the output of fast PMT’s • We already have a SiPM test bench here at LAL driven by the “instrumentation” group • This bench will soon be extended to MCPPMT’s • An ANR file has been filed in November for this R&D. It covers both the electronics, detectors and photo-detectors aspects.

  10. Conclusion • We built a USB board to push the SAM chip towards its limits. • Timing measurements showed a timing resolution of ~25 ps rms without any off-chip correction. • Timing resolution with correction and using several samples is under study. • Very small random jitter (few ps), mainly due to clock jitter => work was done to optimize the board performances. • Tests gave us new guidelines for future chips to improve timing performances. • We are now convinced that a single chip can’t be optimum for all applications (long depth vs time precision). • Next circuit will be submitted soon: 5GS/s sampling freq, larger BW (700MHz ?), same techno (0.35µm), larger depth (1024 pts/ch) => target = precision time measurement • Upgraded version of the SAM-USB board will be available within the next days. • Can be used for low cost fast detector testing (already compatible with next circuit). • Will be tested with MCPPMT’s. • More details and results about this in my talk in the electronics session tonight. • A new ps TDC is under design.

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