A summary of system tests at BNL related to the ROD. From a user point of view : Description of the system of the test stand at BNL Various capabilities of our test stand, the works done and the experience Data integrity, continuity and noise up to 100 kHz. presented by Kin Yip. Host 1.
From a user point of view :
Description of the system of the test stand at BNL
Various capabilities of our test stand, the works done and the experience
Data integrity, continuity and noise up to 100 kHz
presented by Kin Yip
Signal from a pulser
(triggered by TTC)
Data (through optical link)
Relative Trigger and Data timing
E, T, 2 calculation takes
less than time than passing
the entire FEB event
(drawn not to scale )
5 sample pulse
(with the right delay time, of course)
Two controllers in two different crates successfully.
Controlling trigger rate successfully.
Pulse from the successfully.
trigger suming analyzer board
Analog vs Digital successfully.
Signals from calibration board
Pulse from the trigger summing analyzer board
Data seen from the ROD using 1 calibration channel
Testing at 100 kHz : Noise/Pedestal Run successfully.
Testing at 100 kHz : Fixed Pattern of 0x111 successfully.
No missing or skipped events
There are events skipped by the FEB because FEB needs ~9.6 µs for digitization
Noise successfully. RMS of the pedestalsComparion of noise measurements
Not surprising probably because our events are separated by the same time interval and there is no overlap between events
E. Ladygin’s noise measurement at BNL for his pre-shaper successfully.
This includes measurements of the amplitudes of the pulses, averages and RMS’ of the pedestals for all 64 channels etc.