atomic force microscopy . MOSAB SBLABN

1. ATOMIC FORCE MICROSCOPU ATOMIC FORCE MICROSCOPU (AFM) (AFM) -Physics (Atomic structures) -Microstructure (CD, DVD, Blu-ray) -Semiconductor (Roughness of solar cell layers) -Life Science (Tooth Implant-morphology study) -Chemistry (Lithography by Local Oxidation of Titanium) -Atomic force microscopy (AFM) is a type of microscopy that gives us really detailed information about the surface of simple at the nano scale.(dimensions and forces ) -The AFM was invented by Gerd Binnig, Calvin F. Quate, and Christopher Herber in 1986 1986. . 1- AFM operates by measuring the force between a probe and the sample. 2- AFM measures the vertical and lateral deflections of the cantilever by using the optical lever. 3- The optical lever operates by reflecting a laser beam off the cantilever. 4- The reflected laser beam strikes a position- sensitive photo 5- Detector consisting of a four-segment photo- detector. 6- Plotting the laser deflection against the tip position on the sample surface creates a topology of the surface. to more understand watch this: References: -youtube.com -en.wikipedia.org -chemical.eng.unimelb.edu.au -analyticalprofessional.blogspot.com Prepared by: MOSAB SUBLABN Student no: 2020512118 mosabf.2020.ii@gmail.com