1 / 4

Plasmon enhanced thin-film solar cells: Advanced theoretical analysis and ellipsometric characterization

Plasmon enhanced thin-film solar cells: Advanced theoretical analysis and ellipsometric characterization. Supervisor: Jesper Jung Postdoc jung@nano.aau.dk Room: 5.140. Introduction. Present day solar cells Silicon Abundance in nature Microelectronic industry Thick (~250 m m) Expensive.

larissa
Download Presentation

Plasmon enhanced thin-film solar cells: Advanced theoretical analysis and ellipsometric characterization

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. Plasmon enhanced thin-film solar cells: Advanced theoretical analysis and ellipsometric characterization Supervisor: Jesper Jung Postdoc jung@nano.aau.dk Room: 5.140

  2. Introduction • Present day solar cells • Silicon • Abundance in nature • Microelectronic industry • Thick (~250 mm) • Expensive

  3. The idea of the project • Plasmon enhanced solar cells • Thin-film silicon layer (~2mm) • Metal nanoparticels • Localized surface plasmon resonances • Scatter and enhance light strongly at LSP resonances • Analysis using ellipsometry • Theoretical model • Sample fabrication • Measurements

  4. Possible contents • Theoretical work • Modeling of light scattering and absorption of metal nanoparticles in layered geometries • Effective medium theory (Maxwell-Garnett) • Modeling of ellipsometer systems • Experimental work • Fabrication of metal nanoparticles • Fabrication of thin film structures • Measuring using the ellipsometer in the clean room

More Related