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Bellerophon on Pegasus

Fabrication news. Bellerophon on Pegasus. CMM’s under qualification. Metrology news. Continuous High Speed Scanning Probe head LSP-S4 ULF - probing force : 2g – 16g -max. Styli weight : 1000g -max. Styli extension : 800mm -max. Probing frequency: 20pts/min -max Moving speed: 300 mm/sec

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Bellerophon on Pegasus

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  1. Fabrication news S. Atieh RF structure development meeting Bellerophon on Pegasus

  2. CMM’s under qualification Metrology news Continuous High Speed Scanning Probe head LSP-S4 ULF - probing force : 2g – 16g -max. Styli weight : 1000g -max. Styli extension : 800mm -max. Probing frequency: 20pts/min -max Moving speed: 300 mm/sec -max. Acceleration: 1500 mm/sec² Continuous Scanning Probe head LSP-S4 ANF - probing force : 1g – 6g -max. Styli weight : 450g -max. Styli extension : 500mm -max. Probing frequency: 6 – 8 pts/min -max Moving speed: 80 mm/sec -max. Acceleration: 100 mm/sec² - mini. probing force : 5g Leitz PMM-C Infinity Measuring range in mm: X = 1200, Y = 1000, Z = 700 Volumetric length measuring error: E = 0.3 + L / 1000 [μm] Volumetric probing error: P = 0.4 μm Resolution: 0.004 μm UPMC CARRAT ULTRA Measuring range in mm: X = 1150, Y = 850, Z = 600 Volumetric length measuring error: E = 0.4 + L / 1000 [μm] Volumetric probing error: P = 0.5 μm S. Atieh RF structure development meeting

  3. UPMC CARRAT ULTRA Metrology news Probing mark - mini. probing force : 5g S. Atieh RF structure development meeting

  4. Observations TRIMEK Metrology news Non conform to CERN’s specification t ≤ 100 nm S. Atieh RF structure development meeting

  5. KEK metrology Metrology news • ZEISS社製UPMC-850 CARAT • Probing force 5 g • φ83.5 μm, depth 1.91 μm Probing depth on discs with and without annealing Toshiyasu Higo S. Atieh RF structure development meeting

  6. Damped disc CLIAAS110070VTT (FI) Shape accuracy of 50 µm (Deviation due localisation errors) Very accurate and stable shape Fabricated by milling Qualification Section 4 S. Atieh RF structure development meeting

  7. Damped disc CLIAAS110070Heeze(NL) Section1 Shape accuracy of 24 µm Qualification S. Atieh RF structure development meeting

  8. HDS thick CLIAAS300062 DMP (ES) Qualification Origins translation: X 16 µm and Z -8 µm Shape accuracy is respected ± 2.5 µm Additional tests for 2010: PETS (CLIAP11_0037) & AS disc damped S. Atieh RF structure development meeting

  9. PETS (CLIAP11_0037) • Shape accuracy 4.8 µm • (15 µm nominal) • Roughness Ra 120 -180 nm • (100 nm nominal) Qualification KERN Micro- und Feinwerktechnik GmbH (DE) S. Atieh RF structure development meeting

  10. Witness pieces 3 discs / structure (metrology, SEM, spare) News High precision diamond machining Cleaning (light etch) 1 simple disc (new) Diffusion bonding of couplers (H2, 1045 °C) 1 simple disc (new) Cleaning couplers (degreasing) 1 simple disc (new) Diffusion bonding of disk stack (H2, 1035 °C) 1 simple disc (new) Brazing of cooling circuits , tuning (Au Cu, 1020 °C) 1 simple disc (new) Vacuum baking (650 °C >10 d) 1 simple disc (new) 6+1 (0 state) = 7 additional discs FC or SPDT discs are required S. Atieh RF structure development meeting

  11. Material / machining test matrix Kugler (DE) Different machinability behavior f (charge, th. Treatment) Surface finish↓ Degradation in diamond tools and fraction ↑ Geometrical aspects: flatness ↓ meeting withe Kugler→ material related test to done Non conformities Pictures of scrap discs: Goals: Identify the machining problems Reproducibility The adapted th. treatment cycle and copper quality. Is CERN’s choice the best one (forged cupper or not?) S. Atieh RF structure development meeting

  12. Roughness of 11WNSDvg1_KC (VDL) Nominal Ra 25 nm Actual Ra 68 nm Arithmetic roughness of an ideal roughness profile can be approximated by Ra ≈ 0.032f2/R (the real surface roughness is often found to be worse than the above ideal surface roughness) For the same tool nose radiuswe have to decrease feed per workpiece revolution 60 % of actual value (↑machining time = 1.6x more) Non conformities S. Atieh RF structure development meeting

  13. Flatness measurements inlet inspection on ref. A Non conformities S. Atieh RF structure development meeting

  14. Flatness CLIAAS110163 – CELL 22 STR1 Non conformities Piece mesuree a l’etat libre S. Atieh RF structure development meeting

  15. Flatness CLIAAS110163 – CELL 22 STR1 Non conformities Defaut de planeite : 52.4 microns S. Atieh RF structure development meeting

  16. Flatness CLIAAS110163 – CELL 22 STR1 After TT @1000°C Non conformities 11WDSDVG1.8T CLIAAS110163 #1 Flatness before TT: 52 µm Flatness after TT: 436 µm S. Atieh RF structure development meeting

  17. CERN’ actions Re-indicate the state in the drawing Common measuring support Non conformities Cell Ø80mm S. Atieh RF structure development meeting

  18. Hybide Damped Structure (HDS) to look ahead S. Atieh RF structure development meeting

  19. (HDS) to look ahead • Advantageous / traditional milling-turning technics • The best quality where needed • Simple geometry • Plug and play (alignment) S. Atieh RF structure development meeting

  20. ? Thank for your attention S. Atieh RF structure development meeting

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