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Chemical identification of individual surface atoms by atomic force microscopy

Chemical identification of individual surface atoms by atomic force microscopy. Donovan Sung EE235 Student Presentation 4/16/08. Atomic Fingerprinting. Goal: Identify different elements on a surface quickly and reproducibly using only a mechanical probe Challenges:

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Chemical identification of individual surface atoms by atomic force microscopy

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  1. Chemical identification of individual surface atoms by atomic force microscopy Donovan Sung EE235 Student Presentation 4/16/08

  2. Atomic Fingerprinting Goal: Identify different elements on a surface quickly and reproducibly using only a mechanical probe Challenges: 1. The AFM tip tends to change shape over time 2. Difficult to precisely position the AFM tip Tin Lead Silicon Pb on Si(111) Sn on Si(111)

  3. Atomic Force Microscopy Principle: An AFM operated in ultrahigh vacuum (UHV) in noncontact mode can be used to detect the chemical forces between the outermost atom of the AFM tip and the atoms on the surface.

  4. Dynamic Force Microscopy As the tip approaches the surface, different forces come into play depending on the distance between tip and surface.

  5. Atom Tracking Atom tracking allows for a precise positioning of the tip on different locations over a single molecule, using a feedback system The radius δR must be smaller than the dimensions of the surface atom

  6. Compensation of Lateral Thermal Drift The precision of the positioning control is better than 0.2 Å peak to peak The interaction force can be obtained from the detuning of the resonance frequency of the cantilever with the tip-sample vertical distance

  7. Probing short-range interaction forces (Structure) (Chemistry) Lead, tin, and silicon have similar electronic structures and tend to sit in similar positions on the surface Regardless of the structure and chemistry of the tip, the ratio of the force for lead and tin relative to silicon remains the same

  8. Single-atom chemical identification (a) Si, Sn, Pb mixed equally (b) Pb surrounded by Si Lead and tin atoms are nearly indistinguishable in topography in (a), while silicon and lead are indistinguishable in (b). However, the ratio of forces remains the same, allowing easy identification of the atoms in each case.

  9. Conclusion • This work helps to establish the AFM as a metrology tool on the atomic scale • Quick and reproducible way to identify atoms quickly, which should be widely applicable • Developed a “standard” for identifying atoms, similar to element-specific forms of spectroscopy

  10. References Abe, M. et al. “Room-temperature reproducible spatial force spectroscopy using atom-tracking technique.” Applied Physics Letters 87, 173503 (2005). Sugimoto, Y. et al. “Chemical identification of individual surface atoms by atomic force microscopy.” Nature446, 64-67 (2007).

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