I-beam

1. Electrode Discontinuity Characterization in Multilayer CapacitorsClive A. Randall, Pennsylvania State Univ University Park, DMR 0606352 Serial-sectioning Schematic The performance of electrical components such as multi-layer ceramic capacitors (MLCC) is controlled by the local heterogeneities such as electrode discontinuities. Accurate characterization of such defects has been made possible by serially sectioning MLCC cross-section using focused ion beam (FIB). A series of images generated by this technique can be used to reconstruct three-dimensional images which can reveal the exact shape and size of these electrode discontinuities and make it possible for us to measure electrode continuity more accurately. MLCC cross-section I-beam Three-dimensional MLCC cross-section generated using serially sectioned images

2. Electrode Discontinuity Characterization in Multilayer CapacitorsClive A. Randall, Pennsylvania State Univ University Park, DMR 0606352 The presence of electrode discontinuities leads to local enhancement in electric field which in turn leads to higher leakage current and inferior degradation resistance. This is shown in a finite element simulation in an MLCC microstructure which shows that the electric field is 5.4 times the average value near the discontinuity. Such studies have a broader impact not only on the capacitor industry but also in other devices which use multilayer technology, such as multilayer actuators, multilayer varistors, solid oxide fuel cells, etc. Better processing of the interface with thick film technologies should have a direct impact on these local high field regions that limit performance in present day devices. 1 V -1 V 2.44 MV/m -0.209 MV/m Maximum Electric Field Enhancement = 5.42