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IN THE NAME GOD

IN THE NAME GOD. Advanced VLSI Class Presentation A 1.1GHz Charge Recovery Logic Insructor : Dr. Fakhrayi Presented by : Mahdiyeh Mehran. Adopted From: A 1.1GHz Charge Recovery Logic. Visvesh S. Sathe Juang-Ying Chueh Marios C. Papaefthymiou University of Michigan, Ann Arbor, USA.

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IN THE NAME GOD

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  1. IN THE NAME GOD Advanced VLSI Class PresentationA 1.1GHz Charge Recovery Logic Insructor : Dr. Fakhrayi Presented by : Mahdiyeh Mehran

  2. Adopted From:A 1.1GHz Charge Recovery Logic Visvesh S. Sathe Juang-Ying Chueh Marios C. Papaefthymiou University of Michigan, Ann Arbor, USA

  3. Contributions • First ever demonstration of fully integrated charge-recovery chip in 0.13mm CMOS at GHz clock rates • Boost Logic : Dynamic charge-recovery circuit family • Chain of test gates (1600 gates total) • Integrated inductor and clock generator • Resonant operation at 850MHz, 1.3V • Functional at 1.1GHz, 1.4V • Energy recovery rate at resonance = 60%

  4. Outline • Charge Recovery – Brief overview • Basic Principles • Boost Logic structure • Boost Logic operation • Boost Logic test chip • Chip measurement results

  5. Brief Overview of Charge Recovery v Vin R I Vin Vin » + VC VC C C - time I time T Ref.[1] • Gradual transition of power supply (Power-Clock). • Supply must enable recovery of charge. • Inductor used to resonate power clock.

  6. Outline • Charge Recovery – Brief overview • Basic Principles • Boost Logic structure • Boost Logic operation • Boost Logic test chip • Chip measurement results

  7. VC = Vdd’ – Vss’ = Vth Vdd’ = (Vdd + Vth)/2 Vss’ = (Vdd - Vth)/2

  8. Boost Logic: Hybrid Charge Recovery out out Ref.[1] • Two-stage operation : Logic and Boost • Logic Stage performs logical evaluation • Boost Stage takes output nodes to full rail.

  9. Boost Logic: Hybrid Charge Recovery Ref.[1] • Two-stage operation : Logic and Boost • Logic Stage performs logical evaluation • Boost Stage takes output nodes to full rail.

  10. Boost Logic Structure Ref.[1]

  11. Outline • Charge Recovery – Brief overview • Basic Principles • Boost Logic structure • Boost Logic operation • Boost Logic test chip • Chip measurement results

  12. Boost Logic Inverter Ref.[1]

  13. Boost Logic Operation f out 1.2 out 0.6 f 0 t (s) Logic Stage Drives Outputs Ref.[1] Boost Stage deactivated – all 4 devices in cutoff. • Clocked transistors turn on, enabling evaluation. • Logic stage drives output nodes to conventional rails.

  14. Boost Logic Operation f Ref.[1] • With f = Vss’ and f = Vdd’ clocked transistors turn off. • Boost Stage remains tri-stated from output. • Pre-resolved output nodes provided to Boost Stage. 1.2 0.6 f 0 t (s) Both Stages Tri-stated

  15. Boost Logic Operation f out f 1.2 out 0.6 0 t (s) Boost Stage Amplifies Outputs Ref.[1] • As f (f) crosses Vdd’ (Vss’), Boost stage turns on. • Transistors M2 and M3 turn on. • Outputs track power clock.

  16. Boost Logic Operation f out 1.2 out f 0.6 0 t (s) Boost Stage Charge Recovery Ref.[1] • As f (f) moves toward Vss(Vdd) • Transistors M2 and M3 turn on. • Charge in load capacitance returns to resonant clock. • As V(out) – V(out) ≈ Vth, all 4 devices are in cutoff.

  17. Cascade Simulation Logic Boost (V) f 1.0 in 0.5 out out 0 0n 0.5n 1n t (s) f in i1 i0 Ref.[1] • Logic cascaded with alternate clock phases. • Vgs’< 0 in logic evaluation trees when off. • Low Vth devices desirable in logic evaluation trees.

  18. Outline • Charge Recovery – Brief overview • Basic Principles • Previous work • Issues with previous charge recovery logic • Boost Logic structure • Boost Logic operation • Boost Logic test chip • Chip measurement results

  19. Boost Logic Test Chip Ref.[1] • Oscillation driven by reference clock. • Programmable clock generator • Variable Duty Cycle 0%<D<50% • Variable Switch Width 0<W<450µm

  20. Boost Logic Test Chip : Die Shot Clock generator switches Boost Logic gate chains Clock generator switches Programmable Schmitt triggers • Capacitance per phase = 29pF • Inductance = 2.4nH (2 layers, Cu, 0.7µm thick)

  21. Outline • Charge Recovery – Brief overview • Basic Principles • Previous work • Issues with previous charge recovery logic • Boost Logic structure • Boost Logic operation • Boost Logic test chip • Chip measurement results

  22. Energy/Current Measurements 50 40 Energy Current 45 35 40 30 Current (mA) Energy Dissipation per Cycle (pJ) 35 25 Resonant Frequency 30 20 25 15 0.7 0.8 0.9 1.0 1.1 Operating Frequency (GHz) Ref.[1] • Energy measured for all possible W, D, Vdd and Vc • At resonance (850MHz): • Energy dissipation in Vdd = 26pJ [40% of CV2] • Energy dissipation in VC = 4pJ [VC = 0.45V]

  23. Conclusion • First ever charge-recovery test chip to exceed 1GHz clock rate • Boost Logic : Dynamic charge-recovery circuit family • Fully-integrated clock generator and inductor in 0.13mm CMOS • Functional up to 1.1GHz • Resonant frequency = 850MHz • Energy recovery rate at resonance = 60%

  24. References [1] V. S. Sathe, et al., “A 1.1GHz Charge-Recovery Logic,”ISSCC, pp.388-390, Feb., 2006. [2] V. S. Sathe, et al., “A GHz-Class Charge Recovery Logic,” ISLPED, pp.91-94, Aug., 2005. [3] S. Kim, et al., “True Single-Phase Adiabatic Circuitry,” Transactions on VLSI Systems, pp. 52-63, Feb., 2001. [4] D. Suvakovic, C. Salama, “Two Phase Non-Overlapping Clock Adiabatic Differential Cascode Voltage Switch Logic (ADCVSL),” ISSCC Dig.Tech.Papers, pp. 364-365, Feb., 2000. [5] D. Maksimovic, V. Oklobdzija, B. Nikolic, and K. Current “Clocked CMOS Adiabatic Logic with Integrated Single-Phase Power-Clock Supply,”Transactions on VLSI Systems, Aug., 2000.

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