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End Cap Board Testing Status at Penn July 14, 2004. Anton & Campion Mitch. Tools. thrate program Threshold ramp examines occupancy. Edge Rate ( Frequency Plots). tpscan program Will be used on second pass to examine low gain chips for internal connectivity.
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End Cap Board Testing Statusat PennJuly 14, 2004 Anton & Campion Mitch
Tools thrate program • Threshold ramp examines occupancy. • Edge Rate ( Frequency Plots). tpscan program • Will be used on second pass to examine low gain chips for internal connectivity. DVM measurements • Verify continuity to ASICS, low level diagnosis of problems.
‘A’ Wheel Boards from NBI Received 12 Tested 12 • 4 Shorts on NAIS Connectors • 8 ASD’s with > 20 DAC cnts Low Offset • 5 ASD’s with 10<Offset<20 • 19 ASD’s with “ Low “ Gain
Example Anomolies High Offset Not Typical Failure Low Gain Normal ASD Chip ASD A0060215
ASD Anomolies Threshold Scan edge rate analysis Low Gain High Offset Not Typical Failure Normal ASD Chip ASD A0060215
Low Threshold Offsets ASD A0059587 ASD A0063033
‘B’ Wheel Boards from NBI Total of 11 - Results from 8 Tabulated • 1 No detected problem • 2 Shorted input pins • 1 Questionable output • 1 Bad ASD output • 2 Possibly misaligned connectors (intermittent missing channel ) • 6 Lo gain • 2 Offset > 20 • 1 10< Offset< 20
B Wheel Board #VNG0061 ASD #A0062930 Unusual Input Resistance on low gain channels 12, 14, 14, 15K ohms
Algen Boards 25 received - 19 tested • 0 Assembly Errors • 6 Offset > 20 30, 40, 45, …. • 9 10< Offset < 20 • 1 Lo Gain
ASDBLR Questions • Is the IMS testing accurate enough? • Is the selection working? ( Yes so far.) • Do we want to change the threshold offset acceptance windows? • Do we want additional IMS cut criteria?