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Robert S Pannell

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  • 3 Presentations
  • United States
  • Joined 12/07/2018
  • Uploads (3)
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Uploads

Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride
Using Atomic Diffraction to Measure the van der Waals Coefficient for Na and Silicon Nitride
  • 146 views
Threads II
Threads II
  • 207 views
Motiva PFM360 Personal  Listening System
Motiva PFM360 Personal Listening System
  • 123 views
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