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High-energy Performance of X-ray Imaging Spectrometers on board Astro-E. Kensuke Imanishi H. Awaki, T. G. Tsuru, K. Hamaguchi, H. Murakami, M. Nishiuchi, and K. Koyama Kyoto University, Japan. XIS (X-ray Imaging Spectrometer). X-ray CCD camera on board Astro-E

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high energy performance of x ray imaging spectrometers on board astro e

High-energy Performance of X-ray Imaging Spectrometers on board Astro-E

Kensuke Imanishi

H. Awaki, T. G. Tsuru, K. Hamaguchi,

H. Murakami, M. Nishiuchi, and K. Koyama

Kyoto University, Japan

xis x ray imaging spectrometer
XIS (X-ray Imaging Spectrometer)
  • X-ray CCD camera on board Astro-E
  • Front illuminated, Frame transfer
pulse height distribution of xis 55 fe
Pulse Height distribution of XIS (55Fe)

Mn Ka

(5.89keV)

104

Mn Kb

(6.49keV)

Low energy tail

Peak structure

103

102

Counts

101

100

10 -1

0

1000

2000

Channel

divide the response function into 6 components
Divide the response function into 6 components

Main peak

Counts

Sub peak

Triangle

component

Si escape

Si line

Constant

component

Channel

slide5

Osaka

University

Kyoto University

Si K edge

10

0

5

X-ray

Energy

[ keV ]

Al

Fe

Ni

Zn

Se

Cl

Ti

55Fe

Obtained data points

Fluorescent X-ray

Radio isotope

slide6

electron

cloud

X-ray

Depletion

Gate

Insulator

Main

peak

Main peak, Sub peak, Triangle component

Sub peak

Triangle

component

Channel

Stop

slide8

Energy resolution (= Main peak width)

200

Energy resolution [eV]

100

Readout noise

Wsi : mean ionization energy

F : Fano factor

Poisson statistics

eV

slide9

1500

data

calculation

1000

Assumption

1. Electron distribution is sphere with uniform density.

2. Electron cloud radius = 1.71X10-6E1.75 [cm]

(Janesick et al. 1986)

3. Electrons generated in the insulator are not counted.

Channel

500

Gate

Constant component

Insulator

Depletion

0

103

104

102

101

100

10 -1

Counts

slide10

Relative Intensity of constant component

Blue : data

Green : calculation result

Red : multiplied the calculation result by 1.59

10 -1

Constant intensity / Main peak intensity

10 -2

10

1

Energy [keV]

slide11

Si fluorescent X-ray

(1.74keV)

data

simulation

model

Si line

10

Si escape

3

Energy [keV]

3

Total

Si line

2

1

Si escape and Si line

Si escape

2

1

10 -2

10 -3

Escape intensity/Main peak intensity

slide12

Si fluorescent X-ray

(1.74keV)

data

simulation

model

Si line

10

Si escape

3

Energy [keV]

Total

Si line

2

3

2

Si escape

2

1

10 -2

10 -4

10 -3

Si line intensity/Main peak intensity

reproducibility of the response function
Reproducibility of the response function

55Fe (Mn)

response function

Ka:5.894keV

Kb:6.489keV

Mn L

summary
Summary
  • The response function of XIS CCD camera was constructed.
    • We considered the physical process inside the CCD, and divided the response into 6 components.
    • Shape and Intensity of these components were determined as a function of X-ray energy.