Vlsi testing - PowerPoint PPT Presentation

EE 587 SoC Design &amp; Test

EE 587 SoC Design &amp; Test. Partha Pande School of EECS Washington State University pande@eecs.wsu.edu. Final Exam Review. System Level Design Issues. SoC Interconnection Architectures Drawback of bus-based systems in terms of timing, power and other relevant parameters

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HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT. Vishwani D. Agrawal Agere Systems Processor Architectures and Compilers Research Murray Hill, NJ 07974 va@agere.com http://cm.bell-labs.com/cm/cs/who/va June 5, 2001. MY RESEARCH. Delay Test High-speed test

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VLSI Testing

VLSI Testing. 李昆忠 Kuen-Jong Lee 06-2757575 X 62371 kjlee@mail.ncku.edu.tw September 13, 2011. IC Design &amp; Production Flow. 1. Design House 2. Foundry 3. Foundry or Testing House 4. Packaging House 5. Testing House. IC Design &amp; Design-for-Test. Wafer Manufacturing. Wafer Testing.

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Vlsi testing - PowerPoint PPT Presentation

EE 587 SoC Design &amp;amp; Test

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT

VLSI Testing

EE 587 SoC Design & Test