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High-Level Spectral ATPG for Gate-level Circuits

High-Level Spectral ATPG for Gate-level Circuits. Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE Auburn, AL 36849. Outline. Need for High Level Testing Problem and Approach Spectral analysis and generation of test sequences RTL testing approach

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407 views • 28 slides

Scan design techniques

Scan design techniques. J. M. Martins Ferreira FEUP / DEEC - Rua Dr. Roberto Frias 4200-537 Porto - PORTUGAL Tel. 351 225 081 748 / Fax: 351 225 081 443 (jmf@fe.up.pt / http://www.fe.up.pt/~jmf). Objectives. To introduce the basic concepts in design for test

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488 views • 27 slides

Danger of programming bugs

Automated security testing with Flinder SEARCH-LAB Security Evaluation Analysis and Research Laboratory Ltd. Danger of programming bugs. “Every interesting program contains at least one variable, at least one cycle and at least one bug. ” – Murphy ’s law

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330 views • 10 slides

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