'Test de dx pid' presentation slideshows

dE/dx measurement with Phobos Si-pad detectors - very first impressions (H.P Oct 17 1998)

dE/dx measurement with Phobos Si-pad detectors - very first impressions (H.P Oct 17 1998). What characterizes dE/dx in Si?. In the MIP range: measure momentum and and amplitude for which particles are minimum ionizing in thin silicon detectors In the high p range:

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