'Test clock' presentation slideshows

TEST TIME OPTIMIZATION In Scan Circuits

532 views • 36 slides

Lecture 26 Logic BIST Architectures

Lecture 26 Logic BIST Architectures. Motivation Built-in Logic Block Observer (BILBO) Test / clock systems Test / scan systems Circular self-test path (CSTP) BIST Circuit initialization Loop-back hardware Test point insertion Summary. Motivation.

465 views • 27 slides

ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTEMS

ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTEMS. Built-In Self-Test (BIST) - 2. Overview: Logic BIST. Motivation Built-in Logic Block Observer (BILBO) Test / clock systems Test / scan systems Circular self-test path (CSTP) BIST Circuit initialization Test point insertion

245 views • 24 slides

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT. Vishwani D. Agrawal Agere Systems Processor Architectures and Compilers Research Murray Hill, NJ 07974 va@agere.com http://cm.bell-labs.com/cm/cs/who/va January 16, 2002. MEANING OF DELAY TEST. V1 V2. Transient region. Inputs.

137 views • 13 slides

Memory Level Access

Memory Level Access. October 22, 2007. Memory Level Access Status. Areas of Agreement Standard CTL for Functional Operations Timing is optional (point to STA Library) Areas Needing Definition Enumeration of Purposes for Macros Scheduling and Compatibility of Operations

219 views • 8 slides

Reduced Voltage Test Can be Faster!

Reduced Voltage Test Can be Faster!. Vishwani D. Agrawal vagrawal@eng.auburn.edu. Effects of Reducing Supply Voltage. Critical path slows down. Power reduces as V 2 . Test produces more than functional activity; consumes more power that the circuit is designed for.

159 views • 4 slides