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Testing Semiconductor Memories

Testing Semiconductor Memories

Testing Semiconductor Memories. Cheng-Wen Wu ???. Lab for Reliable Computing Dept. Electrical Engineering National Tsing Hua University. Outline. Introduction RAM functional fault models and test algorithms RAM fault-coverage analysis Cocktail-March for testing word-oriented memories

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2.23k views • 180 slides
Chapter 8

Chapter 8

Chapter 8. Memory Testing and Built-In Self-Test. What is this chapter about?. B asic concepts of memory testing and BIST Memory fault models and test algorithms Memory fault simulation and test algorithm generation RAMSES: fault simulator TAGS: test algorithm generator Memory BIST

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1.5k views • 90 slides
Chapter 8

Chapter 8

Chapter 8. Memory Testing and Built-In Self-Test. What is this chapter about?. B asic concepts of memory testing and BIST Memory fault models and test algorithms Memory fault simulation and test algorithm generation RAMSES: fault simulator TAGS: test algorithm generator Memory BIST

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925 views • 90 slides
By WAN ZUHA WAN HASAN (UPM) DEPARTMENT OF ELECTRICAL, ELECTRONIC AND SYSTEM,

By WAN ZUHA WAN HASAN (UPM) DEPARTMENT OF ELECTRICAL, ELECTRONIC AND SYSTEM,

THE DESIGN OF THE MEMORY BUILT-IN SELF-TEST, DIAGNOSIS AND REPAIR (MBISTDR) FOR SRAMs. By WAN ZUHA WAN HASAN (UPM) DEPARTMENT OF ELECTRICAL, ELECTRONIC AND SYSTEM, FACULTY OF ENGINEERING UKM Supervised by PROF DR MASURI OTHMAN (UKM) Co-supervisor DR BAMBANG SUNARYO SUPARJO

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819 views • 64 slides
By WAN ZUHA WAN HASAN (UPM) DEPARTMENT OF ELECTRICAL, ELECTRONIC AND SYSTEM,

By WAN ZUHA WAN HASAN (UPM) DEPARTMENT OF ELECTRICAL, ELECTRONIC AND SYSTEM,

THE DESIGN OF THE MEMORY BUILT-IN SELF-TEST, DIAGNOSIS AND REPAIR (MBISTDR) FOR SRAMs. By WAN ZUHA WAN HASAN (UPM) DEPARTMENT OF ELECTRICAL, ELECTRONIC AND SYSTEM, FACULTY OF ENGINEERING UKM Supervised by PROF DR MASURI OTHMAN (UKM) Co-supervisor DR BAMBANG SUNARYO SUPARJO

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854 views • 64 slides
A PERIMETRIC RE-TEST ALGORITHM THAT IS SIGNIFICANTLY MORE ACCURATE THAN CURRENT PROCEDURES

A PERIMETRIC RE-TEST ALGORITHM THAT IS SIGNIFICANTLY MORE ACCURATE THAN CURRENT PROCEDURES

A PERIMETRIC RE-TEST ALGORITHM THAT IS SIGNIFICANTLY MORE ACCURATE THAN CURRENT PROCEDURES. Allison McKendrick Department of Optometry and Vision Science University of Melbourne. Andrew Turpin School of Computer Science and Information Technology RMIT University, Melbourne. Darko Jankovic

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370 views • 30 slides
Built-In Self-Test for Multipliers

Built-In Self-Test for Multipliers

Built-In Self-Test for Multipliers. Mary Pulukuri Dept. of Electrical & Computer Engineering Auburn University. Outline of Presentation. Overivew of multiplier architectures History of Digital Signal Processor (DSP) Architectures in FPGAs Overview of Virtex-4 DSP

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366 views • 22 slides
ECT data sharing plan

ECT data sharing plan

ECT data sharing plan. Which products do you intend to make available for use by other teams in their data analysis? When will these products be available? What products do you need from other teams? When do you need these products to be available?

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268 views • 18 slides
ECT data sharing plan

ECT data sharing plan

ECT data sharing plan. Which products do you intend to make available for use by other teams in their data analysis? When will these products be available? What products do you need from other teams? When do you need these products to be available?

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240 views • 18 slides
Applications deployed by WP10 on testbed1

Applications deployed by WP10 on testbed1

Applications deployed by WP10 on testbed1. V. Breton DataGrid conference. List of applications. Bio-informatics Bio-informatics web portal : IBCP (C. Blanchet) Parasitology : LBP Clermont (N. Jacq) Phylogenetics : BBE Lyon (T. Sylvestre) Search for primers : Centrale Paris (K. Kurata)

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145 views • 6 slides

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