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Lecture 31 System Test

Lecture 31 System Test

Lecture 31 System Test Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary A System and Its Testing

By bernad
(413 views)

Lecture 25 Built-In Self-Testing Pattern Generation and Response Compaction

Lecture 25 Built-In Self-Testing Pattern Generation and Response Compaction

Lecture 25 Built-In Self-Testing Pattern Generation and Response Compaction. Motivation and economics Definitions Built-in self-testing (BIST) process BIST pattern generation (PG) BIST response compaction (RC) Aliasing probability Example Summary. BIST Motivation.

By uri
(394 views)

Lecture 31 System Test

Lecture 31 System Test

Lecture 31 System Test. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

By nam
(181 views)

Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard

Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard

Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard. Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller Boundary scan instructions Summary. Motivation for Standard. Bed-of-nails printed circuit board tester gone

By nay
(352 views)

Lecture 31 System Test

Lecture 31 System Test

Lecture 31 System Test. Definition Functional test Diagnostic test Fault dictionary Diagnostic tree System design-for-testability (DFT) architecture System partitioning Core test-wrapper DFT overhead Summary. A System and Its Testing.

By selena
(139 views)

Lecture 13 Sequential Circuit ATPG Time-Frame Expansion

Lecture 13 Sequential Circuit ATPG Time-Frame Expansion

Lecture 13 Sequential Circuit ATPG Time-Frame Expansion. Problem of sequential circuit ATPG Time-frame expansion Nine-valued logic ATPG implementation and drivability Complexity of ATPG Cycle-free and cyclic circuits Asynchronous circuits Summary. Sequential Circuits.

By inge
(103 views)

Lecture 29 IEEE 1149.1 JTAG Advanced Boundary Scan & Description Language (BSDL)

Lecture 29 IEEE 1149.1 JTAG Advanced Boundary Scan & Description Language (BSDL)

Lecture 29 IEEE 1149.1 JTAG Advanced Boundary Scan & Description Language (BSDL). Special scan cells and pins Cell timing / wiring constraints Cell delay measurements Boundary Scan Description Language Summary. Observe-Only Scan Cell. Control & Observe Scan Cell. Bidirectional Pins.

By yestin
(123 views)

Lecture 15 Memory Test

Lecture 15 Memory Test

Lecture 15 Memory Test. Memory market and memory complexity Notation Faults and failures MATS+ March Test Memory fault models March test algorithms Inductive fault analysis Summary. Density and Defect Trends. 1970 -- DRAM Invention (Intel) 1024 bits 1993 -- 1st 256 MBit DRAM papers

By deion
(238 views)


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