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EE434 ASIC & Digital Systems

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Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard

Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard. Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller Boundary scan instructions Summary. Motivation for Standard. Bed-of-nails printed circuit board tester gone

733 views • 32 slides

Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard

Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard. Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller Boundary scan instructions Summary. Motivation for Standard. Bed-of-nails printed circuit board tester gone

356 views • 32 slides

BOUNDARY SCAN

BOUNDARY SCAN. IEEE 1149.1 JTAG Boundary Scan Standard. Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller Boundary scan instructions. Motivation for Standard. Bed-of-nails printed circuit board tester gone

630 views • 31 slides

JTAG Boundary Scan

JTAG Boundary Scan. IEEE 1149.1 JTAG Boundary Scan Standard. Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller Boundary scan instructions Summary. Motivation for Standard.

1.29k views • 24 slides