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Probe motion - PowerPoint PPT Presentation


Undulator Bench Requirements

Undulator Bench Requirements

Undulator Bench Requirements. Zack Wolf SLAC. Introduction. We require a measurement bench to move probes through the undulators. To purchase the bench, we must determine specifications for it: Physical characteristics such as the length must be determined.

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224 views • 20 slides



Atomic Force Microscope Nanoindentation/Scratching

Atomic Force Microscope Nanoindentation/Scratching

Atomic Force Microscope Nanoindentation/Scratching. Nanoindentation/Scratching. Elastic & plastic material properties are obtained from load-displacement data, but knowledge of the true area of contact is critical. sink-in. Load (µN). Stiffness, S:. (nm). pile-up.

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337 views • 7 slides


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