'New technical challenges' presentation slideshows

The Usage of Focused Ion Beam(FIB) and Other Diagnostic Equipment to Reduce Cycle Time and Cost on System-on-Chip(SoC) D

The Usage of Focused Ion Beam(FIB) and Other Diagnostic Equipment to Reduce Cycle Time and Cost on System-on-Chip(SoC) Designs. Raymond Lee, Tongxin Lu and Patrick Wolpert FIB International, Inc. Santa Clara California USA. FIB Introduction. DUT. lens 2 (objective). octopole 2. octopole 1.

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