'Make board test easier' presentation slideshows

VLSI DESIGN Lecture 10 Design for Testability

VLSI DESIGN Lecture 10 Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

615 views • 33 slides

VLSI DESIGN Lecture 10 Design for Testability

VLSI DESIGN Lecture 10 Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

366 views • 33 slides

EE466: VLSI Design Lecture 17: Design for Testability

EE466: VLSI Design Lecture 17: Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

329 views • 31 slides

301 views • 19 slides

336 views • 19 slides