'International test conference' presentation slideshows

Electronic Presentation Guide

443 views • 33 slides

Power-aware NOC Reuse on the Testing of Core-based Systems*

Power-aware NOC Reuse on the Testing of Core-based Systems*. CSCE 932 Class Presentation by Xinwang Zhang April 26, 2007 * Erika Cota, et al., International Test Conference, 2003. Outline. Researching background and motivation NOC reuse on the testing Power-Aware NOC reuse during test

379 views • 17 slides

Alien Hardware Diagnosis in ICs Using Path Delay Measurements

Alien Hardware Diagnosis in ICs Using Path Delay Measurements. Spyros Tragoudas (PI ) Dept . of Electrical and Computer Engineering Southern Illinois University, Carbondale, IL 62901. Project Overview and Description. Problem Diagnosis of multiple delay-defective embedded segments

266 views • 17 slides