Full scan design - PowerPoint PPT Presentation

Design of benchmark circuit s5378 for reduced scan mode activity

Nelson Sunwoo. Design of benchmark circuit s5378 for reduced scan mode activity. objective. Modify s5378 to full scan design Modify scan flip flops to prevent switching in combination logic Compare average power consumption of original and enhanced design. Problem with testing.

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312 views • 11 slides

Design of benchmark circuit s5378 for reduced scan mode activity

★ ★ ★ ★ ★

253 views • 11 slides

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