'Frequency degradation' presentation slideshows

NBTI impact mitigation techniques Guard-banding Size up devices Toggle circuit nodes

Silicon Odometer : An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits. NBTI impact on digital circuits F max Leakage current SRAM cell stability SRAM read/write margin. NBTI impact mitigation techniques Guard-banding Size up devices Toggle circuit nodes

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