'Ec ec et ef' presentation slideshows

EE 5340 Semiconductor Device Theory Lecture 13 - Fall 2009

EE 5340 Semiconductor Device Theory Lecture 13 - Fall 2009 Professor Ronald L. Carter ronc@uta.edu http://www.uta.edu/ronc Reverse bias junction breakdown E crit for reverse breakdown (M&K**) Taken from p. 198, M&K** Casey Model for E crit Reverse bias junction breakdown

736 views • 29 slides

373 views • 25 slides

EE 5340 Semiconductor Device Theory Lecture 14 - Fall 2010

EE 5340 Semiconductor Device Theory Lecture 14 - Fall 2010. Professor Ronald L. Carter ronc@uta.edu http://www.uta.edu/ronc. Shockley-Read- Hall Recomb. E. Indirect, like Si, so intermediate state. E c. E c. E T. E f. E fi. E v. E v. k. S-R-H trap characteristics M&K.

291 views • 20 slides