'Design cycle time' presentation slideshows

Functional Test Program Generation for Microprocessors

Functional Test Program Generation for Microprocessors. Prabhat Mishra. Outline. Introduction Test Program Generation: Taxonomy Test Program Generation Techniques Past Approaches Present Trends Future Directions Conclusion References. Introduction.

589 views • 43 slides

Impact of Guardband Reduction on Design Process Outcomes

Impact of Guardband Reduction on Design Process Outcomes. Kwangok Jeong (kjeong@vlsicad.ucsd.edu) Andrew B. Kahng (abk@cs.ucsd.edu) Kambiz Samadi (kambiz@vlsicad.ucsd.edu) University of California, San Diego. Outline. Motivation Background Model Guardband Reduction

487 views • 31 slides

Drop and Impact of Mobile Telephone

247 views • 24 slides