'Delay fault' presentation slideshows

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614 views • 58 slides

Reconvergent Fanout Analysis of Bounded Gate Delay Faults

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Reconvergent Fanout Analysis of Bounded Gate Delay Faults

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4. Combinational Logic Networks . 4.2 Layout Design Methods 4.2.1 Single Row Layout Design

4. Combinational Logic Networks . 4.2 Layout Design Methods 4.2.1 Single Row Layout Design. Power rails Routing chnnel n-type, p-type row. Intra-row Routing area. Structure of a routing channel. Horizontal tracks and vertical tracks Channel Density, changed with pin assignment.(below).

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Topics

Topics. Switch networks. Combinational testing. Boolean functions and switches. pseudo-AND. pseudo-OR. Driving switch outputs. If switch network output is not connected to power supply through switch path, output will float.

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VLSI Testing Lecture 9: Delay Test

VLSI Testing Lecture 9: Delay Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 28, 2012, 8:00-9:00AM. Contents.

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VLSI Testing Lecture 9: Delay Test

VLSI Testing Lecture 9: Delay Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 28, 2012, 8:00-9:00AM. Contents.

267 views • 26 slides

VLSI Testing Lecture 9: Delay Test

VLSI Testing Lecture 9: Delay Test. Delay test definition Circuit delays and event propagation Path-delay tests Non-robust test Robust test Five-valued logic and test generation Path-delay fault (PDF) and other fault models Test application methods

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Delay Fault Simulation with Bounded Gate Delay Model

Delay Fault Simulation with Bounded Gate Delay Model. Soumitra Bose Design Technology, Intel Corp. Folsom, CA 95630 Hillary Grimes and Vishwani D. Agrawal Dept. of ECE, Auburn University Auburn, AL 36849. Purpose. Investigate min-max delay simulation used for process variation

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IDDQ Testing

IDDQ Testing. Slides based on Kewal Saluja. Overview. History and motivation Basic principle Faults detected by I DDQ tests Instrumentation difficulties Sematech study Limitations of I DDQ testing Summary. Motivation.

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Delay Fault Simulation with Bounded Gate Delay Model

Delay Fault Simulation with Bounded Gate Delay Model. Soumitra Bose Design Technology, Intel Corp. Folsom, CA 95630 Hillary Grimes and Vishwani D. Agrawal Dept. of ECE, Auburn University Auburn, AL 36849. Purpose. Investigate min-max delay simulation used for process variation

292 views • 20 slides

Analyzing Reconvergent Fanouts in Gate Delay Fault Simulation

Analyzing Reconvergent Fanouts in Gate Delay Fault Simulation. Hillary Grimes & Vishwani D. Agrawal. Dept. of ECE, Auburn University Auburn, AL 36849. Outline. Problem Statement Reconvergent Fanout Analysis Ambiguity Lists Fault Detection Detection Threshold Detection Gap Results

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