'Conclusionsand' presentation slideshows

Interface roughness scattering in ultra-thin GaN channels in N-polar enhancement-mode GaN MISFETs

Interface roughness scattering in ultra-thin GaN channels in N-polar enhancement-mode GaN MISFETs. Uttam Singisetti*, Man Hoi Wong, Jim Speck, and Umesh Mishra ECE and Materials Departments University of California, Santa Barbara, CA 2011 International Symposium on Compound Semiconductors

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