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Phase Delay in MAC-based Analog Functional Testing in Mixed-Signal Systems

Phase Delay in MAC-based Analog Functional Testing in Mixed-Signal Systems. Jie Qin, Charles Stroud, and Foster Dai Dept. of Electrical and Computer Engineering 200 Broun Hall, Auburn University, AL 36849-5201 emails: qinjie1/strouce/daifa01@auburn.edu. Outline. Motivation and Background

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334 views • 17 slides

TOPIC : Classification of BIST Architectures

UNIT 5 : BIST and BIST Architectures. TOPIC : Classification of BIST Architectures. Module 5.1 Introduction to BIST. Requirements for BIST process. For any self testing process, the following are necessary: Circuit under test (CUT), Test pattern generator (TPG),

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280 views • 5 slides

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Bist circuitry - PowerPoint PPT Presentation

Phase Delay in MAC-based Analog Functional Testing in Mixed-Signal Systems

TOPIC : Classification of BIST Architectures