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?????????? VLSI ???? ?? ???

?????????? VLSI ???? ?? ???

?????????? VLSI ???? ?? ???. ? 3 ? ?????? (2) ??? ?????????? Email: lxw@ict.ac.cn http://test.ict.ac.cn. Chapter 2. Design for Testability. Design For Testability - contents. Introduction Testability Analysis Design for Testability Basics Scan Cells Designs Scan Architectures

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1.47k views • 88 slides
Training Neural Networks

Training Neural Networks

Training Neural Networks. Robert Turetsky Columbia University rjt72@columbia.edu Systems, Man and Cybernetics Society IEEE North Jersey Chapter December 12, 2000. Objective. Introduce fundamental concepts in Artificial Neural Networks Discuss methods of training ANNs

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907 views • 58 slides
?????????? VLSI ???? ?? ???

?????????? VLSI ???? ?? ???

?????????? VLSI ???? ?? ???. ? 2 ? ?????? (1) ??? ?????????? Email: lxw@ict.ac.cn http://test.ict.ac.cn. Chapter 2. Design for Testability. Design For Testability - contents. Introduction Testability Analysis Design for Testability Basics Scan Cells Designs Scan Architectures

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745 views • 49 slides
ELEC 7770 Advanced VLSI Design Spring 2008 Combinational Circuit ATPG

ELEC 7770 Advanced VLSI Design Spring 2008 Combinational Circuit ATPG

ELEC 7770 Advanced VLSI Design Spring 2008 Combinational Circuit ATPG. Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal/COURSE/E7770_Spr08/course.html. ATPG Problem.

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531 views • 35 slides
The Boundary Scan Test (BST) technology

The Boundary Scan Test (BST) technology

The Boundary Scan Test (BST) technology. J. M. Martins Ferreira FEUP / DEEC - Rua dos Bragas 4050-123 Porto - PORTUGAL Tel. 351-22-2041748 / Fax: 351-22-2003610 (jmf@fe.up.pt / http://www.fe.up.pt/~jmf). Objectives.

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497 views • 31 slides
Murali Venkatasubramanian Vishwani D. Agrawal

Murali Venkatasubramanian Vishwani D. Agrawal

Murali Venkatasubramanian Vishwani D. Agrawal Ph.D. Candidate James J. Danaher Professor Department of Electrical and Computer Engineering Auburn University.

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301 views • 30 slides
HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT. Vishwani D. Agrawal Agere Systems Processor Architectures and Compilers Research Murray Hill, NJ 07974 va@agere.com http://cm.bell-labs.com/cm/cs/who/va June 5, 2001. MY RESEARCH. Delay Test High-speed test

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262 views • 14 slides

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