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Weighted Random and Transition Density Patterns for Scan-BIST

Weighted Random and Transition Density Patterns for Scan-BIST. Farhana Rashid* Vishwani D. Agrawal Auburn University ECE Department, Auburn, Alabama 36849 * Presently with Intel Corp., Austin, Texas 78746. A BIST Architecture. p 1 = Prob {bit = 1}, or TD = Prob {bit makes transition}.

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Adaptive testclock - PowerPoint PPT Presentation

Weighted Random and Transition Density Patterns for Scan-BIST