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Understanding Current Thresholds in Sintef's 3Dv1.1 - Test Results Analysis

This study analyzes test results from Sintef's 3Dv1.1 model, focusing on diode-like HV currents, LV currents, and threshold scans. Variations in current levels, noise measurements, and the impact of voltage adjustments are investigated to optimize performance.

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Understanding Current Thresholds in Sintef's 3Dv1.1 - Test Results Analysis

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  1. First Tests on Sintef 3Dv1.1 19.11.2009 Alessandro Rovani Claudia Gemme

  2. 04081_96 • Working on 16.11 con diode like HV current (0.4uA@10V), normal LV currents and threshold scan reasonable. • Today bad: see IV scans, high LV currents (A=279mA/D=170mA) and Threshold non sense 18.11 16.11

  3. 12071_97 • HV glued • HV current high 10uA@10V but ok LV currents • Noise@10V =450e • Noise vs HV:

  4. 01081_102 • HV wirebonded • HV current high 8uA@10V but ok LV currents • Noise =470e

  5. 01081_102 • Moving at higher threshold and higher voltages helps • Scan at 30V GDAC= 14 (threshold=3300e) vs GDAC =20 (threshold=4000e)

  6. Am SourceHv =30V threshold=4400e Threshold tuned Tot tuned Am scan Charge Am scan

  7. 01082_106 • HV wirebonded • HV current high 10uA@10V but ok LV currents • Noise =860e

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